Segmented STEM Detection for Low-Dose Atomic Contrast

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Solution Overview

Problem

Conventional annular detectors in scanning transmission electron microscopy (STEM) struggle to provide high contrast images of light elements due to limited anisotropy information and increased irradiation damage, leading to decreased signal-to-noise ratios under lower electron dose conditions.

Innovation Solution

A segmented detector with multiple detection regions is used in conjunction with a computer system to generate segmented images and apply filters based on signal-to-noise ratio, optimizing the total phase contrast transfer function to enhance image contrast.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional annular detector is used to detect electrons transmitted through specimen, then observation of light elements can be achieved, but signal-to-noise ratio decreases under lower electron dose conditions

Engineering Contradiction:
Improvesignal-to-noise ratioVSAvoidirradiation damage
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The annular detector is divided into multiple segmented detection regions arranged in specific patterns (e.g., four-fold rotational symmetry). Each segment detects electrons from specific scattering angles and directions, allowing independent optimization of detection parameters for each region while collectively improving the overall signal-to-noise ratio for light element imaging.

Inventive Principle:
Principle #1Segmentation

2Object-affected harmful factors

If lower electron dose conditions are used to reduce irradiation damage, then specimen damage is reduced, but image contrast and signal-to-noise ratio decrease

Engineering Contradiction:
Improveirradiation damageVSAvoidimage contrast
Core Design Contradiction:
Object-affected harmful factorsVSMeasurement precision

Solution Approach 1:

Different detection regions are assigned different functions and optimization parameters based on their local characteristics. Inner segments detect low-angle scattered electrons for light element contrast, while outer segments detect high-angle scattered electrons for heavy element contrast. This local optimization allows maintaining high image contrast at lower electron doses by selectively detecting signals most relevant to the specimen features of interest.

Inventive Principle:
Principle #3Local quality

3Adaptability or versatility

If conventional annular detector is used, then simple detection structure is maintained, but anisotropy information of electron scattering is lost

Engineering Contradiction:
Improveanisotropy informationVSAvoiddetector structure
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The segmented detector breaks the rotational symmetry of conventional annular detectors by creating distinct segments with different angular positions and detection characteristics. This asymmetric segmentation allows the detector to resolve anisotropy in electron scattering patterns, providing directional information about atomic arrangements and bonding orientations in the specimen while maintaining a relatively simple segmented structure.

Inventive Principle:
Principle #4Asymmetry

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for high-contrast observation of atoms in specimens even under lower electron dose conditions, reducing irradiation damage and improving image quality by maximizing the signal-to-noise ratio.

Implementation Method 1

scanning a highly convergent electron beam (probe) over a specimen and detecting electrons transmitted through and scattered from each point of the specimen by a detector

Methodology Applied
Scientific EffectElectron scattering: Scattering

Implementation Method 2

acquiring results of detecting the electrons transmitted through the specimen using a segmented detector having a plurality of detection regions disposed in a bright-field area

Methodology Applied
Scientific EffectElectron transmission:

Data Source

PatentEP4057320B1Observation method by means of scanning transmission electron microscope, scanning transmission electron microscope system, and program
Publication Date: 2024.07.24 THE UNIV OF TOKYO
  • EP4057320B1 patent drawingFigure 1
  • EP4057320B1 patent drawingFigure 2~3
  • EP4057320B1 patent drawingFigure 4

AI summary

Using a segmented detector having detection regions enables an observation of atoms in a specimen with a high contrast. A scanning transmission electron microscope system 100 scans an electron beam EB over a specimen S, uses a segmented detector 105 having detection regions disposed in a bright-field area to detect electrons transmitted through and scattered from the specimen S for each detection region, generates segmented images based on results of detecting the electrons in the detection regions, and applies filters determined based on a signal-to-noise ratio to the segmented images to generate a reconstructed image. The signal-to-noise ratio is proportional to an absolute value of a total phase contrast transfer function normalized by a noise level, the total phase contrast transfer function being defined by product-sum operation of complex phase contrast transfer functions and weight coefficients for the detection regions. The filters are determined based on the weight coefficients that yield a maximum of the signal-to-noise ratio.