Segmented STEM Imaging for Low-Dose Phase Contrast Reconstruction

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional annular detectors in scanning transmission electron microscopes (STEM) have limitations in capturing anisotropy of electron scattering and are prone to irradiation damage when observing light elements, leading to reduced signal-to-noise ratios and limited high-contrast imaging, especially under lower electron dose conditions.

Innovation Solution

A segmented detector with multiple detection regions is used in conjunction with a computer system to generate segmented images and apply filters based on signal-to-noise ratio optimization, enhancing the contrast of STEM images by leveraging the absolute value of a total phase contrast transfer function normalized by noise levels.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of information

If conventional annular detectors are used to detect transmitted electrons, then the observation of specimen structure is enabled, but information on anisotropy of electron scattering cannot be acquired

Engineering Contradiction:
Improveinformation on anisotropy of electron scatteringVSAvoiddetector structure
Core Design Contradiction:
Loss of informationVSDevice complexity

Solution Approach 1:

The annular detector is divided into multiple segmentation regions arranged circumferentially around the electron beam axis. Each segmentation region detects electrons scattered at different azimuthal angles, enabling acquisition of anisotropy information while maintaining the annular detection geometry. The segmentation regions collectively cover the annular detection area, with each region contributing partial information that is synthesized to reveal complete anisotropy characteristics.

Inventive Principle:
Principle #1Segmentation

2Object-affected harmful factors

If lower electron dose conditions are used to reduce irradiation damage, then the specimen is protected from damage, but the signal-to-noise ratio of the image decreases

Engineering Contradiction:
Improveirradiation damageVSAvoidsignal-to-noise ratio
Core Design Contradiction:
Object-affected harmful factorsVSMeasurement precision

Solution Approach 1:

The detected electron signal is divided into multiple segmentation region signals, and independent phase contrast transfer functions are determined for each region. By synthesizing these segmented signals with their respective transfer functions, the system achieves enhanced signal-to-noise ratio through coherent integration, allowing lower electron dose operation while maintaining image quality.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system determines phase contrast transfer functions for each segmentation region based on the detected electron signals and uses this information to reconstruct the specimen image with optimized contrast. The feedback loop involves analyzing the scattered electron distribution in each segmentation region and adjusting the phase contrast transfer function to maximize signal utilization while minimizing noise.

Inventive Principle:
Principle #23Feedback

3Measurement precision

If segmented detector with multiple detection regions is used to capture anisotropy information, then the signal-to-noise ratio can be optimized, but the device complexity increases

Engineering Contradiction:
Improvesignal-to-noise ratioVSAvoiddetector structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The annular detector is segmented into multiple regions that detect electrons at different azimuthal angles. Each segmentation region has an associated phase contrast transfer function that is determined independently. The segmented signals are then synthesized using these transfer functions to produce high-contrast images with optimized signal-to-noise ratio while capturing anisotropy information.

Inventive Principle:
Principle #1Segmentation

4Measurement precision

If conventional ABF technique is used for observing light elements, then the observation of light elements such as hydrogen, lithium, or oxygen is enabled, but the observation is limited by irradiation damage and low signal-to-noise ratio

Engineering Contradiction:
Improveobservation of light elementsVSAvoidirradiation damage and low signal-to-noise ratio
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The annular detector is divided into multiple segmentation regions that capture scattered electrons from light elements at different azimuthal angles. By determining phase contrast transfer functions for each segmentation region and synthesizing the signals, the system achieves enhanced signal-to-noise ratio that enables observation of light elements like hydrogen, lithium, and oxygen under lower electron dose conditions, reducing irradiation damage while maintaining observation capability.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for high-contrast observation of atoms in specimens, even under lower electron dose conditions, reducing irradiation damage and improving the visibility of light elements like lithium and oxygen, while maintaining high signal quality.

Implementation Method 1

detecting electrons transmitted through and scattered from each point of the specimen by a detector

Methodology Applied
Scientific EffectElectron scattering: Scattering

Implementation Method 2

acquiring results of detecting the electrons transmitted through the specimen using a segmented detector having a plurality of detection regions disposed in a bright-field area

Methodology Applied
Scientific EffectElectron transmission:

Data Source

PatentUS12154758B2Observation method by means of scanning transmission electron microscope, scanning transmission electron microscope system, and computer readable medium
Publication Date: 2024.11.26 THE UNIV OF TOKYO
  • US12154758B2 patent drawing
  • US12154758B2 patent drawing
  • US12154758B2 patent drawing

AI summary

An observation method using a scanning transmission electron microscope for scanning an electron beam over a specimen and detecting electrons transmitted through the specimen includes: acquiring results of detecting the electrons transmitted through the specimen using a segmented detector having detection regions disposed in a bright-field area; and generating segmented images based on the results of detecting the electrons in the detection regions, and applying filters determined based on a signal-to-noise ratio to the segmented images to generate a reconstructed image. The signal-to-noise ratio is proportional to an absolute value of a total phase contrast transfer function normalized by a noise level, the total phase contrast transfer function being defined by product-sum operation of phase contrast transfer functions expressed by complex numbers and weight coefficients for the detection regions. The filters for the detection regions are determined based on the weight coefficients that yield a maximum of the signal-to-noise ratio.