Segmented Automated Test Platform With Data Sequencers
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Solution Overview
Problem
Automated test equipment systems are often rigid and proprietary, making them difficult to adapt and scale for testing various electronic components effectively.
Innovation Solution
A segmented automated test platform is introduced, featuring multiple subsystem segments with data sequencers and DMA engines that allow for coordinated execution of instructions and data transfer between CPU subsystems, instrument hardware, and digital signal processing units via a PCIe-based event fabric, enabling flexible and scalable testing configurations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If automated test equipment systems use proprietary and rigid designs, then system stability is maintained, but adaptability and scalability are reduced
Solution Approach 1:
The automated test equipment is divided into multiple independent subsystems that can be configured and scaled independently. Each subsystem contains its own data sequencer and functional units, allowing the system to be adapted to different testing requirements by selecting and combining appropriate subsystems rather than redesigning the entire system.
Solution Approach 2:
The system employs universal interfaces and standardized communication protocols (such as PCIe-based event fabric) that allow different subsystems to work together seamlessly. The data sequencers and functional units are designed to handle multiple test types and configurations, enabling one system to serve multiple testing purposes.
2Productivity
If automated test equipment systems are designed for high automation, then testing efficiency is improved, but system flexibility and ease of adaptation are reduced
Solution Approach 1:
The system architecture allows dynamic configuration of subsystems and test sequences. The data sequencers can be programmed with different instruction sets to adapt to various testing scenarios, and subsystems can be dynamically added or removed from the test configuration without requiring complete system redesign, thus maintaining both automation and flexibility.
3Adaptability or versatility
If segmented subsystems with multiple data sequencers are implemented, then system adaptability is improved, but device complexity increases
Solution Approach 1:
The system is segmented into independent functional units, each with its own data sequencer. This segmentation allows the system to scale by adding or removing specific subsystems based on testing needs, rather than increasing the complexity of a monolithic system. Each segment remains relatively simple while the overall system achieves high scalability.
Data Source
AI summary
A segmented subsystem, for use within an automated test platform, includes a first subsystem segment including a first data sequencer configured to coordinate the execution of one or more instructions within the first subsystem segment. A second subsystem segment includes a second data sequencer configured to coordinate the execution of one or more instructions within the second subsystem segment.