Segmented X-ray Detector Row for Variable Resolution Imaging
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Solution Overview
Problem
Existing X-ray inspection systems require expensive solutions to quickly switch between standard and high-resolution views, as they need to process excessive intensity data or use multiple detector arrays, which is costly and inefficient.
Innovation Solution
A detector row is divided into sections with varying grid sizes for different resolutions, allowing for quick switching between standard and high-resolution views by adjusting the readout frequency, enabling the generation of X-ray images with both standard and high resolutions using the same detector line.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a detector array is dimensioned for maximum required resolution to display areas at higher resolution, then measurement precision is improved, but device complexity and data processing load increase significantly
Solution Approach 1:
The detector array is divided into multiple sections, each with different resolutions. A first section has a first resolution suitable for standard viewing, while a second section has a second resolution higher than the first. This segmentation allows the system to capture high-resolution data only where needed, reducing overall complexity while maintaining the capability for high-resolution imaging of specific areas.
Solution Approach 2:
Different sections of the detector array are assigned different resolution qualities based on local requirements. The second section is configured with higher resolution for areas requiring detailed inspection, while the first section uses lower resolution for standard viewing areas. This local differentiation optimizes measurement precision where needed without unnecessarily increasing device complexity across the entire array.
2Measurement precision
If two detector arrays are provided for standard and high resolution scanning, then measurement precision is improved, but device complexity and cost increase
Solution Approach 1:
Multiple resolution capabilities are merged into a single detector array by integrating sections with different resolutions. The first section and second section coexist in one detector array, allowing the system to switch between standard and high-resolution scanning without requiring separate detector arrays. This reduces device complexity and cost while maintaining the ability to provide both standard and high-resolution images.
Solution Approach 2:
The detector array is designed with multi-functionality, where a single array serves both standard-resolution and high-resolution scanning purposes. The first section handles standard resolution requirements while the second section provides high-resolution capability, making the detector array universal and eliminating the need for multiple separate arrays.
3Measurement precision
If the readout frequency is increased to match high-resolution section requirements, then measurement precision is improved, but energy consumption and data processing load increase
Solution Approach 1:
The readout frequency is made dynamic and adaptable to the selected imaging mode. When standard-resolution imaging is required, the readout frequency operates at a lower level appropriate for the first section. When high-resolution imaging is needed, the readout frequency increases to match the requirements of the second section. This dynamic adjustment optimizes energy consumption by avoiding unnecessary high-frequency readouts during standard operations while maintaining the capability for high-resolution imaging when required.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces production costs and minimizes X-ray exposure while providing better image quality by allowing for efficient switching between standard and high-resolution views without the need for dual detector arrays, improving the overall efficiency and cost-effectiveness of X-ray inspections.
Implementation Method 1
detector elements arranged longitudinally for the detection of X-rays
Data Source
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AI summary
The present invention relates to an X-ray inspection system (100; 200) for the non-destructive inspection of inspection objects (P; F, C) and a corresponding method, wherein the X-ray inspection system (100; 200) for the non-destructive inspection of inspection objects (P; F, C) comprises: a detector unit (106; 206) with a detector row (10) which has detector elements (12, 14) arranged in a longitudinal direction (LR) for the detection of X-rays (108; 208) and whose longitudinal direction (LR) is arranged at an angle, preferably orthogonal, to a scanning direction (AR) for line-by-line scanning of an inspection object (P; F, C), wherein the detector row (10) is used to scan the inspection object (P;F, C) is set up in at least a first section (A1.1, A1.2) of the detector row (10) with first detector elements (12) for a first resolution and at least in a further section (A2) of the detector row (10) with further detector elements (14) for a second resolution which is higher than the first resolution, wherein the X-ray inspection system (100; 200) is set up based on intensity values for X-rays detected by means of the detector elements (12, 14) of at least one row of an X-ray image for the inspection object (P;F, C) and further comprises a control unit (116) which is configured to read out all detector elements (12, 14) of the detector row (10) at a readout frequency determined by the further section (A2) with the highest resolution and simultaneously to generate an X-ray image with the first resolution based on intensity information acquired by the entire detector row (10) as well as at least one further X-ray image with the second resolution based on intensity data acquired in the at least one further section (A2).