Selective Event Logging Circuit for Data Storage
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Solution Overview
Problem
Analyzing log data from data storage devices is computationally complex and time-consuming, often taking days or weeks, making it infeasible due to engineering deadlines, especially when dealing with large volumes of data.
Innovation Solution
A data storage device is configured to selectively log and delete event results, keeping only failed events while discarding successful ones, reducing the size and complexity of log data, thereby simplifying analysis and decreasing storage capacity and manufacturing costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If all event results are logged during data storage device operation, then complete test data is available for analysis, but the size and complexity of log data increases significantly
Solution Approach 1:
The patent extracts only the essential information (failure conditions) from the complete event log. The circuit is configured to discard successful events and retain only failed events, extracting the critical subset of data needed for debugging while eliminating redundant information about successful operations.
Solution Approach 2:
The patent applies different treatment to different parts of the log data based on their significance. Successful events are discarded (simplified treatment) while failed events are retained (detailed treatment), creating a log with non-uniform quality that focuses resources on the most important information.
2Reliability
If all event results are logged during data storage device operation, then complete test data is available for analysis, but the time required to analyze log data increases to days or weeks
Solution Approach 1:
The patent extracts only the essential information (failure conditions) from the complete event log. The circuit is configured to discard successful events and retain only failed events, extracting the critical subset of data needed for debugging while eliminating redundant information about successful operations.
Solution Approach 2:
The patent performs partial logging by recording only a subset of events (failed events) rather than all events. This partial action is sufficient for debugging purposes since successful events are already known to work correctly and don't require analysis.
3Reliability
If all event results are logged during data storage device operation, then complete test data is available for analysis, but the storage capacity required increases
Solution Approach 1:
The patent extracts only the essential information (failure conditions) from the complete event log. The circuit is configured to discard successful events and retain only failed events, extracting the critical subset of data needed for debugging while eliminating redundant information about successful operations.
Solution Approach 2:
The patent discards successful events that consume storage space but provide minimal debugging value. By selectively discarding non-essential data (successful events) while retaining essential data (failed events), the system optimizes storage utilization.
Data Source
AI summary
An apparatus includes one or more processors configured to execute instructions to generate a plurality of event results that includes a first event result and a second event result. The apparatus further includes a first buffer coupled to the one or more processors and a second buffer coupled to the first buffer. The first buffer is configured to store the plurality of event results. The apparatus further includes a circuit coupled to the first buffer. The first buffer is further configured to provide the first event result to the second buffer in response to detection by the circuit of a failure condition associated with the first event result.