Self-Aligned Coupling Gate Layout for Split-Gate Memory Scaling

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Solution Overview

Problem

There is a need to scale down the size of non-volatile memory cells while maintaining performance, simplify processing steps, and reduce operational voltages and power consumption in semiconductor devices with split-gate memory cells.

Innovation Solution

A semiconductor device with a self-aligned coupling gate structure, comprising a floating gate, a select gate, and a coupling gate insulated by a uniform thickness oxide layer, allowing for precise capacitive coupling and reduced operational voltages, and a method of forming and operating such memory cells with fewer masking steps.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of moving object

If conventional memory cell structures are used, then memory cell size is larger, but device density and scalability are reduced

Engineering Contradiction:
Improvememory cell sizeVSAvoiddevice density
Core Design Contradiction:
Area of moving objectVSProductivity

Solution Approach 1:

The coupling gate is positioned to wrap around the floating gate structure, with portions adjacent to and over the floating gate, creating a nested configuration that maximizes space utilization and enhances capacitive coupling without increasing footprint area

Inventive Principle:
Principle #7Nested doll (Nesting)

Solution Approach 2:

The coupling gate extends in multiple spatial dimensions, with portions at different heights relative to the floating gate, utilizing vertical dimensionality to achieve enhanced coupling while maintaining planar footprint for high density

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Manufacturing precision

If precise gate alignment is achieved through self-alignment, then manufacturing precision is improved, but processing complexity increases

Engineering Contradiction:
Improvegate alignment precisionVSAvoidprocessing steps
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The coupling gate is formed using self-alignment to the floating gate, where the floating gate structure itself serves as the alignment reference, eliminating the need for separate alignment steps and reducing processing complexity while maintaining high precision

Inventive Principle:
Principle #25Self-service

3Manufacturing precision

If uniform thickness insulation layer is used, then manufacturing precision is improved, but operational voltage requirements increase

Engineering Contradiction:
Improveinsulation layer uniformityVSAvoidoperational voltage
Core Design Contradiction:
Manufacturing precisionVSUse of energy by moving object

Solution Approach 1:

The coupling gate structure utilizes localized capacitive coupling regions with specific insulation thicknesses optimized for different functional requirements, allowing low voltage operation in coupled regions while maintaining manufacturing precision through controlled local properties

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables smaller memory cell dimensions, reduced operational voltages, and lower manufacturing costs, with enhanced read, erase, and program performance through self-aligned gates and silicide enhancement.

Implementation Method 1

a coupling gate having a first portion disposed over and insulated from the source region and laterally adjacent to a side surface of the floating gate, and a second portion disposed over and insulated from an upper surface of the floating gate

Methodology Applied
Scientific EffectCapacitive coupling: Capacitance

Data Source

PatentUS20250344382A1Semiconductor device and method with memory cells having coupling gate self-aligned to floating gate
Publication Date: 2025.11.06 SILICON STORAGE TECHNOLOGY INC
  • US20250344382A1 patent drawing
  • US20250344382A1 patent drawing
  • US20250344382A1 patent drawing

AI summary

A semiconductor device that comprises source and drain regions formed in a semiconductor substrate with a channel region extending there between, a floating gate disposed over a first portion of the channel region, a select gate disposed over a second portion of the channel region, and a coupling gate having a first portion disposed over the source region and laterally adjacent to a side surface of the floating gate, and a second portion disposed over an upper surface of the floating gate. The coupling gate is insulated from the source region and from the floating gate by an insulation layer having a uniform thickness between the first portion of the coupling gate and the source region, the first portion of the coupling gate and the side surface of the floating gate, and the second portion of the coupling gate and the upper surface of the floating gate.