Self-Diagnostic Apparatus for Electronic Device Safety
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Solution Overview
Problem
Existing self-diagnostic systems for electronic devices, such as semiconductors and circuit modules, face inefficiencies in operating safety and inability to perform regular or periodic tests while the device is running, particularly in high-safety applications like autonomous vehicles and drones, due to limitations in detecting characteristic changes over time.
Innovation Solution
A self-diagnostic apparatus with a vector memory, test data storage, and a safety region test controller that selects and controls test modes, compares expected and actual test results, and monitors environmental variables like voltage, clock frequency, and temperature to determine safe operating regions and detect degradation, allowing for real-time testing and monitoring even when the device is operational.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a self-diagnostic system is implemented using related art methods, then basic test functionality is provided, but the system cannot perform tests while the device is running and operating efficiency is lowered
Solution Approach 1:
The patent enables continuous testing during device operation by implementing a test controller that can execute diagnostic functions without requiring the device to stop. The test controller selectively controls test signal generation based on operation states, allowing diagnostic operations to continue concurrently with normal device functionality, thus maintaining continuous useful action without interruption.
Solution Approach 2:
The patent implements dynamic test mode selection where the test controller adapts testing behavior based on real-time operation states. The system dynamically switches between different test modes (functional test, DFT test, non-test function) and adjusts test signal generation according to current device state, enabling flexible testing that responds to changing operational conditions without compromising device performance.
2Reliability
If passive test mode entry from external instructions is used, then test execution is achieved, but the system cannot autonomously monitor degradation over time
Solution Approach 1:
The patent implements self-service functionality where the test controller autonomously determines when and what to test based on device operation states without requiring external instructions. The system automatically selects test modes, controls test signal generation, and monitors results, enabling the device to self-diagnose and track its own degradation over time while maintaining high safety integrity levels.
Solution Approach 2:
The patent establishes a feedback mechanism where test results are continuously monitored and used to inform subsequent testing decisions. The test controller receives test results, compares them against expected values, and uses this feedback to adjust future testing behavior, enabling autonomous detection of degradation trends and characteristic changes over time without external intervention.
3Measurement precision
If the device enters diagnostic sleep mode for testing, then test execution is possible, but real-time monitoring during operation cannot be achieved
Solution Approach 1:
The patent implements periodic testing where the test controller executes diagnostic functions at predetermined intervals or based on accumulated operation time. The system performs functional tests, DFT tests, or non-test functions periodically without requiring the device to enter sleep mode, enabling continuous monitoring of characteristic changes while maintaining real-time operation and avoiding time loss from mode switching.
Data Source
AI summary
The present invention relates to a self-diagnostic apparatus capable of improving safety of a device under test (DUT) by analyzing a characteristic change of a DUT, such as a semiconductor, a circuit module, or a system, in a safe operating region over time and allowing a regular test and a periodic test to be performed even while the DUT is running.