Self-Healing Monolithic Integrated Circuits for High-Frequency Yields
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Solution Overview
Problem
High-frequency integrated circuits, particularly mm-wave circuits, face challenges with low manufacturing yields and high economic costs due to process variations and inaccuracies, limiting the integration of large numbers of transistors in silicon using existing technologies.
Innovation Solution
A self-healing monolithic integrated circuit with sensors and actuators that dynamically adjust transistor configurations and matching networks to optimize performance metrics like output power, efficiency, and linearity, using a digital processing core to implement self-healing algorithms and control actuators.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If large numbers of transistors are integrated in silicon using existing process technologies, then circuit functionality is improved, but manufacturing yield deteriorates due to process variations
Solution Approach 1:
The patent applies preliminary action by incorporating sensors and actuators during the manufacturing process to enable real-time monitoring and adjustment. This allows process variations to be detected and corrected before they result in defective circuits, thereby maintaining high integration density while improving manufacturing yield through proactive defect prevention
Solution Approach 2:
The patent implements feedback mechanisms where sensors continuously monitor circuit parameters during manufacturing and operation, and actuators adjust process parameters based on this feedback. This closed-loop system compensates for process variations in real-time, enabling high transistor integration while maintaining acceptable manufacturing yields by dynamically correcting deviations from target specifications
2Reliability
If design margins are increased to improve production yields, then manufacturing yield is improved, but device efficiency deteriorates
Solution Approach 1:
The patent applies dynamics by transitioning from static design margins to dynamic parameter adjustment. Sensors and actuators enable real-time optimization of circuit parameters based on actual process conditions, allowing the system to operate at optimal efficiency points rather than conservative fixed margins, thereby improving both production yield and device efficiency simultaneously
Solution Approach 2:
The patent implements parameter changes by dynamically adjusting circuit operating parameters through actuator control based on sensor feedback. This allows the system to adapt to process variations by changing parameters such as bias voltages, transistor widths, or matching network configurations, achieving high yields without sacrificing device efficiency that would result from fixed conservative design margins
3Reliability
If self-healing techniques are implemented to increase production yields, then manufacturing yield is improved, but device complexity increases
Solution Approach 1:
The patent applies segmentation by dividing the circuit into functional modules with dedicated sensors and actuators for each. This modular approach isolates complexity to specific segments rather than distributing it throughout the entire circuit, making the self-healing system more manageable and easier to implement while achieving improved production yields through targeted monitoring and adjustment of critical parameters
Data Source
AI summary
A self-healing monolithic integrated includes an electronic circuit having a plurality of transistors. At least one sensor is disposed within and electrically coupled to the electronic circuit and configured to sense a performance metric of the electronic circuit. A plurality of actuators is disposed within the circuit. Each actuator of the plurality of actuators has electrically coupled to it a control terminal. The plurality of actuators is configured to perform a selected one of, electrically coupling at least one transistor of the plurality of transistors into the electronic circuit and electrically de-coupling at least one transistor of the plurality of transistors, in response to operation of one of the control terminals to improve the performance metric.