Self-Recovering Digital Latch for Low-Power SEU Correction
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Solution Overview
Problem
High power dissipation and increased system complexity in electro-optical sensors due to large and complex dataword management, especially in infrared imaging applications where single event upsets can alter operational modes undesirably, and existing redundancy solutions like Triple Modular Redundancy consume excessive power and add complexity.
Innovation Solution
An electro-optical sensor chip assembly with an integrated control circuit that uses three sub-latches to redundantly store dataword bits, where the outputs of two sub-latches are connected as recovery inputs to the third, enabling asynchronous correction of faulty bits without the need for continuous refreshing or additional control circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If Triple Modular Redundancy with scrubbing circuit is used to protect datawords, then reliability is improved, but power dissipation increases
Solution Approach 1:
The patent implements periodic scrubbing action where the scrubbing circuit activates at predetermined intervals to detect and correct errors in redundant dataword storage, rather than continuous monitoring. This periodic operation significantly reduces power consumption while maintaining reliability through timely error correction before permanent damage occurs.
Solution Approach 2:
The scrubbing circuit is designed to automatically detect and correct errors in the redundant dataword storage without requiring external intervention. The circuit self-monitors the redundant bits and performs correction operations autonomously, reducing the need for additional control overhead and power consumption associated with external error correction mechanisms.
2Reliability
If Triple Modular Redundancy with scrubbing circuit is used to protect datawords, then reliability is improved, but device complexity increases
Solution Approach 1:
The patent combines the scrubbing circuit functionality directly with the redundant dataword storage structure, merging error detection and correction operations into the existing TMR framework. This integration eliminates the need for separate, complex control circuits and reduces overall device complexity while maintaining comprehensive error protection.
Solution Approach 2:
The scrubbing circuit is designed to handle multiple error correction functions within a single unified structure, capable of detecting and correcting errors across all redundant dataword storage locations. This multi-functional approach reduces the number of dedicated circuits needed and simplifies the overall control architecture.
3Reliability
If dataword is continuously refreshed from external controller, then reliability is improved, but power dissipation increases
Solution Approach 1:
Instead of continuous refreshing, the patent implements periodic scrubbing operations that occur at predetermined intervals. This approach maintains dataword integrity by regularly detecting and correcting errors while dramatically reducing power consumption compared to continuous refresh operations.
Solution Approach 2:
The error correction is performed autonomously by the scrubbing circuit integrated with the dataword storage, eliminating the need for continuous external controller intervention. This self-correcting mechanism reduces power dissipation by removing the overhead of continuous external communication and control signal generation.
4Reliability
If redundancy of each dataword bit is provided, then reliability is improved, but power dissipation increases
Solution Approach 1:
The patent implements periodic scrubbing operations on the redundant dataword bits rather than continuous monitoring and correction. This periodic approach maintains the reliability benefits of redundancy while significantly reducing the power dissipation associated with constant error checking and correction operations.
Solution Approach 2:
The redundant dataword storage with integrated scrubbing circuit performs error detection and correction autonomously without requiring continuous external power-intensive operations. The self-correcting mechanism reduces power consumption by activating correction only when errors are detected during periodic scrubbing intervals.
Data Source
AI summary
An electro-optical sensor chip assembly (SCA) that includes a detection device that includes an array of detector unit cells arranged in a matrix and that produce an electrical output in response to light. The SCA also includes an integrated control circuit in electrical communication with the detection device that includes a control word store to store a dataword. The control word store includes at least three sub-latches to redundantly store at least one bit of the dataword. The at least three sub-latches include a first sub-latch, a second sub-latch and a third sub-latch, each of the first sub-latch, the second sub-latch and the third sub-latch including an output and two recovery inputs, and the output of the first and third sub-latches are connected to the recovery inputs of the second sub-latch.