Self-test Circuitry for Current Control Subsystems
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Solution Overview
Problem
Modern electronic devices with complex circuitry require effective self-test mechanisms to ensure reliable and safe operation, as existing built-in self-test (BIST) systems are inadequate for detecting faults in current sink and source subsystems, particularly short circuits and malfunctions.
Innovation Solution
The implementation of self-test circuitry that includes voltage detection and test voltage source circuitry, coupled with current sensing and controllable switches, allows for the detection of faults by comparing measured voltages and currents against expected values, indicating short circuits or malfunctions between current source and sink subsystems and their terminals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If existing built-in self-test (BIST) systems are used, then the device can perform basic self-testing, but they are inadequate for detecting faults in current sink and source subsystems particularly short circuits and malfunctions
Solution Approach 1:
The patent introduces a measurement node as an intermediary element that serves as a common testing point for multiple current control subsystems. This measurement node, when coupled to load terminals through signal paths, enables centralized voltage detection without requiring separate test circuitry for each subsystem, thus improving reliability while controlling complexity
Solution Approach 2:
The self-test circuitry is designed with universal components that can test multiple current control subsystems simultaneously. The voltage detection circuitry and test voltage source work together with a shared measurement node to provide fault detection across different subsystems (current sources and sinks) using a unified approach, reducing overall test circuitry complexity
2Measurement precision
If voltage detection circuitry and test voltage source are implemented, then faults can be detected by comparing measured voltages against expected values, but the device complexity increases
Solution Approach 1:
The patent merges the test voltage source, voltage detection circuitry, and measurement node into an integrated self-test system. By combining these elements that work together through signal paths to load terminals, the system achieves precise voltage measurement capability while avoiding the complexity of separate independent test systems for each function
3Device complexity
If a common measurement node is used for all signal paths, then the testing mechanism is simplified, but the ability to isolate and identify specific faulty subsystems may be reduced
Solution Approach 1:
The patent segments the testing functionality by providing separate signal paths for each current control subsystem that all converge at a common measurement node. This segmentation allows the test voltage to be applied to and measured from each subsystem individually through its dedicated signal path, enabling fault isolation while maintaining the simplicity of a shared measurement infrastructure
Data Source
AI summary
The present disclosure relates to self-test circuitry for a system that includes one or more current control subsystems, each current control subsystem having a load terminal for coupling the current control subsystem to a load. The self-test circuitry comprises: a signal path associated with each current control subsystem, each signal path configured to selectively couple a measurement node to the load terminal of the current control subsystem, wherein the measurement node is common to all of the signal paths; voltage detection circuitry; and test voltage source circuitry configured to provide a test voltage to the measurement node. The voltage detection circuitry is operable to output a signal indicative of a fault condition if a voltage detected at the measurement node differs from the test voltage when the measurement node is coupled to the load terminal.