Self-testing circuit for dynamic voltage scaling in memory datapaths
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Solution Overview
Problem
Memory devices operating at higher frequencies consume more power and are not power/energy efficient when using supply voltages intended for lower frequencies, leading to inefficient operation.
Innovation Solution
A test circuit is implemented to determine the minimum operable voltage levels for different frequencies, allowing the memory device to configure the supply voltage accordingly, optimizing power efficiency across various operational frequencies.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If a supply voltage enabling high frequency operation is used, then the memory device can operate at higher frequency, but power consumption increases and power efficiency deteriorates
Solution Approach 1:
The patent implements dynamic voltage scaling by making the supply voltage adjustable based on the operating frequency. The memory device can switch between multiple voltage levels (e.g., first voltage level for high frequency, second voltage level for low frequency) to match the actual operational requirements, thereby avoiding continuous operation at high voltage and reducing power consumption when high frequency is not needed.
Solution Approach 2:
The patent changes the voltage parameter dynamically according to the operating frequency. By establishing a relationship between frequency and voltage levels, the system can adjust the supply voltage to the minimum necessary level for the current frequency, optimizing power efficiency while maintaining correct operation. This is achieved through test circuits that determine minimum operable voltage levels for different frequencies.
2Speed
If a supply voltage enabling high frequency operation is used, then the memory device can operate at higher frequency, but power/energy efficiency deteriorates
Solution Approach 1:
The system dynamically adjusts the supply voltage based on the actual operating frequency requirements. When operating at low frequency, the voltage is reduced to a lower level, minimizing energy loss. When high frequency operation is required, the voltage is increased to the necessary level. This dynamic adaptation ensures energy efficiency by avoiding unnecessary voltage overhead.
Solution Approach 2:
The patent implements parameter changes by establishing a mapping between operating frequencies and corresponding voltage levels. Through test circuits, the system determines the minimum operable voltage for each frequency and uses this information to configure the supply voltage, thereby optimizing energy efficiency and reducing energy loss during operation.
3Reliability
If the memory device operates at lower frequency with high frequency supply voltage, then correct operation is ensured, but power efficiency deteriorates
Solution Approach 1:
The patent changes the voltage parameter to match the actual operating frequency. By using test circuits to determine the minimum operable voltage for the current frequency, the system configures the supply voltage to this optimized level. This ensures correct operation while improving power efficiency, as the voltage is neither too high (wasting energy) nor too low (risking incorrect operation).
Solution Approach 2:
The memory device performs self-testing and self-configuration through integrated test circuits that automatically determine the minimum operable voltage for the current frequency. This self-service mechanism allows the device to autonomously optimize its power efficiency without external intervention, ensuring both correct operation and energy efficiency.
Data Source
AI summary
Disclosed is an apparatus including a datapath and a test circuit. The datapath is configured to transfer data between a memory core and an IO interface. The datapath includes a plurality of circuits, and a memory core interface. The plurality of circuits operates according to a supply voltage. The test circuit is coupled to the datapath, and configured to determine, from a set of operable voltage levels of the supply voltage, a first minimum operable voltage level for the datapath to operate for the data traversing the datapath at a first frequency.