Self-testing Sensor Apparatus Mode Switching
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Solution Overview
Problem
Standard testing devices with ferromagnetic components induce uncontrolled magnetic fields, falsifying measurement results in magnetic field sensors, and existing shielding methods are complex and incomplete.
Innovation Solution
A semiconductor component with a mode switching mechanism allowing it to operate in two modes: one for measuring physical quantities and another for testing, where a test signal source simulates the measurement signal, enabling testing without external magnetic fields and without complex shielding, and allowing for evaluation of the evaluator using standard testing equipment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If standard testing devices with ferromagnetic components are used to test the semiconductor component, then testing can be performed, but uncontrolled magnetic fields are induced in the magnetic field sensor, falsifying the measurement result
Solution Approach 1:
The patent segments the testing process into two distinct operational modes: a first mode for normal magnetic field sensing and a second mode for testing using standard devices. The mode switching mechanism separates the testing function from the measurement function, allowing standard testing devices to be used without interfering with measurement accuracy, as the sensor is deactivated or shielded during testing mode.
Solution Approach 2:
The patent implements dynamic switching between operational modes using a mode switching mechanism. The semiconductor component can dynamically transition between the first operating mode (sensing) and the second operating mode (testing), allowing the system to adapt its behavior based on whether measurement accuracy or testing convenience is the priority at any given moment.
2Measurement precision
If magnetic field shielding is implemented to prevent external magnetic fields from affecting the sensor, then measurement accuracy is improved, but the technology becomes complex and expensive
Solution Approach 1:
Instead of implementing permanent complex shielding structures, the patent uses dynamic mode switching to achieve protection during testing. The mode switching mechanism temporarily deactivates the sensor or redirects the signal path during testing operations, providing the necessary protection without requiring physical shielding structures.
Solution Approach 2:
The patent extracts the sensor element from the active signal path during testing operations by using the mode switching mechanism to disconnect or deactivate it. This allows testing to proceed with standard devices without the sensor being exposed to interfering magnetic fields, eliminating the need for physical shielding while maintaining measurement accuracy when in normal operation mode.
3Adaptability or versatility
If the sensor element is kept active during testing to maintain measurement capability, then sensing functionality is preserved, but testing with standard devices becomes impossible due to magnetic field interference
Solution Approach 1:
The patent achieves dual functionality through dynamic mode switching. The semiconductor component can switch between the first operating mode where the sensor is active for measurement, and the second operating mode where the sensor is deactivated or shielded for compatibility with standard testing devices. This dynamic adaptation allows the same component to serve both measurement and testing purposes without compromise.
Solution Approach 2:
The patent makes the semiconductor component universal by enabling it to perform both measurement functions (with the sensor active) and testing functions (with the sensor deactivated or shielded) using the same hardware platform. The mode switching mechanism provides the flexibility needed for the component to be compatible with both precision measurement applications and standard manufacturing testing equipment.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables easy and accurate testing of semiconductor components using standard devices, eliminating the need for expensive shielding and complex technology, while ensuring precise evaluation of both the sensor element and evaluator.
Implementation Method 1
a magnetic field sensor as a sensor element
Implementation Method 2
a test signal source for generating a test signal simulating the measurement signal of the sensor element is arranged on the semiconductor chip
Data Source
AI summary
A semiconductor component on a semiconductor chip comprises at least one sensor element for measuring a physical quantity and an evaluator. The semiconductor component can be switched between a first and a second operating mode. In the first operating mode, the sensor element is sensitive to the physical quantity to be measured and a measurement signal output of the sensor element is connected to an input connection of the evaluator. In the second operating mode, the sensor element is not sensitive to the physical quantity to be measured and/or the signal path between the measurement signal output and the input connection is interrupted. A test signal source for generating a test signal simulating the measurement signal of the sensor element is arranged on the semiconductor chip. In the second operating mode, the test signal source is connected or capable of being connected to the input connection of the evaluator.