Scanning Electron Microscope Vibration Isolation Damper

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Solution Overview

Problem

Conventional desktop scanning electron microscopes suffer from inadequate vibration control due to the control unit, vacuum pump, and cooling fan being mounted on a single platform, leading to vibrations affecting image quality.

Innovation Solution

Extending the damper below the bottom plate and making contact with the installation plane or support members to enhance vibration absorption, thereby lowering the natural frequency and widening the vibration-free frequency band.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Volume of moving object

If the control unit, vacuum pump, and cooling fan are mounted on a single platform in a desktop scanning electron microscope, then the device size is reduced and becomes more compact, but vibration control deteriorates and image quality is degraded

Engineering Contradiction:
Improvedevice sizeVSAvoidvibration
Core Design Contradiction:
Volume of moving objectVSObject-affected harmful factors

Solution Approach 1:

The patent divides the single platform into multiple independent mounting surfaces at different height levels. The control unit is mounted on a first platform, the vacuum pump on a second platform, and the cooling fan on a third platform. This segmentation isolates vibration sources from the electron optical system while maintaining a compact desktop form factor.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces vertical dimensionality by creating platforms at different height levels within the housing. The first platform is at a higher level, the second platform at a lower level, and the third platform at an intermediate level. This three-dimensional arrangement allows vibration isolation while maintaining compact horizontal footprint.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Object-affected harmful factors

If vibration control components are added to improve vibration reduction, then image quality improves, but device complexity increases

Engineering Contradiction:
Improvevibration controlVSAvoidstructure complexity
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The patent combines multiple functions into integrated platform structures. Each platform serves both as a mounting surface and as a vibration isolation element. The platforms are structurally integrated into the housing, eliminating the need for separate vibration isolation components and reducing overall structural complexity.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Improved vibration reduction properties compared to conventional desktop scanning electron microscopes, resulting in clearer images with reduced noise from vibrations.

Implementation Method 1

a damper 13 to support the main scanning electron microscope unit 5 is extended toward an installation plane on which the apparatus is installed and further below the bottom plate 12

Methodology Applied
Scientific EffectVibration absorption: Damping

Data Source

PatentUS8809782B2Scanning electron microscope
Publication Date: 2014.08.19 HITACHI HIGH TECH CORP
  • US8809782B2 patent drawing
  • US8809782B2 patent drawing
  • US8809782B2 patent drawing

AI summary

A scanning electron microscope includes a main scanning electron microscope unit having an electron optical column and a sample chamber, a controller over the main scanning electron microscope unit, a single housing that houses both the main scanning electron microscope unit and the controller, and a bottom plate disposed under the single housing, the main scanning electron microscope unit and the controller. A first leg member is attached to a bottom face of the bottom plate on a side of the controller with a first opening hole provided through the bottom plate on a side of the main scanning electron microscope unit, and a damper is fixed to a bottom face of the main scanning electron microscope unit and disposed through the first opening hole.