SEM Image Cascade Denoising for Defect Inspection Accuracy

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Solution Overview

Problem

Existing denoising algorithms, including machine learning and deep learning techniques, fail to effectively remove noise from scanning electron microscope (SEM) images, and training these models is challenging due to the lack of a ground truth image without noise.

Innovation Solution

A cascade denoising technique is employed, involving a non-machine learning based denoising algorithm followed by a machine learning based denoising algorithm, with a denoised reference image serving as a ground truth for training the machine learning model.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a single denoising algorithm is used on SEM images, then the processing is simple and fast, but the denoising performance is insufficient and noise remains in the images

Engineering Contradiction:
Improvedenoising performanceVSAvoiddenoising process complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The denoising process is segmented into multiple sequential stages: a first denoising algorithm processes the original SEM image to produce an intermediate denoised image, which then serves as input to a second denoising algorithm to produce the final denoised image. This multi-stage segmentation allows each algorithm to specialize in different aspects of noise removal, achieving superior overall denoising performance compared to single-algorithm approaches.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If machine learning based denoising algorithms are used, then denoising performance can be improved, but training these models is challenging due to lack of ground truth images without noise

Engineering Contradiction:
Improvedenoising performanceVSAvoidmodel training difficulty
Core Design Contradiction:
Measurement precisionVSEase of manufacture

Solution Approach 1:

A non-machine learning based denoising algorithm is applied as a preliminary step to generate an intermediate denoised image from the noisy SEM image. This intermediate result serves as a surrogate ground truth for training the machine learning based denoising algorithm, enabling the model to learn effective denoising patterns without requiring access to actual noise-free reference images that do not exist in practice.

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If multiple denoising algorithms are applied in sequence, then the images become cleaner and defect detection accuracy improves, but the processing time and computational resources increase

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidimage processing time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

Different denoising algorithms are selected for the first and second processing stages, each with different computational characteristics. The first algorithm is chosen for its ability to quickly remove prominent noise, while the second algorithm is selected for its effectiveness in removing residual noise. This parameter variation in algorithm selection optimizes the balance between processing time and final image quality, achieving high defect detection accuracy without excessive computational overhead.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS12597102B2Image enhancement in charged particle inspection
Publication Date: 2026.04.07 ASML NETHERLANDS BV
  • US12597102B2 patent drawing
  • US12597102B2 patent drawing
  • US12597102B2 patent drawing

AI summary

An improved systems and methods for generating a denoised inspection image are disclosed. An improved method for generating a denoised inspection image comprises acquiring an inspection image; generating a first denoised image by executing a first type denoising algorithm on the inspection image; and generating a second denoised image by executing a second type denoising algorithm on the first denoised image.