SEM Sample Plate Holder with Independent Spring Arrays
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Solution Overview
Problem
Existing sample plate holders for scanning electron microscopes are limited in their ability to simultaneously hold multiple sample plates of varying thicknesses, often requiring frequent adjustments in focus depth during observation.
Innovation Solution
A sample plate holder with a storage space that accommodates multiple sample plates, featuring independently operable pressing-up element arrays on either side to stabilize and align the plates at a reference level, allowing for consecutive observation without significant focus depth changes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If multiple sample plates of different thicknesses are stored in the holder, then the quantity of samples that can be observed consecutively is improved, but the alignment precision of upper surfaces deteriorates
Solution Approach 1:
The pressing-up elements are designed to be movable and adjustable, allowing dynamic adaptation to sample plates of different thicknesses. Each pressing-up element can independently move vertically to apply appropriate pressing force regardless of the sample plate thickness, thereby maintaining upper surface alignment precision while accommodating multiple samples.
Solution Approach 2:
The pressing force parameter is made adjustable through the pressing-up elements, which can change their pressing intensity based on the thickness of each sample plate. This parameter change capability allows the holder to maintain consistent upper surface alignment across samples with varying thicknesses.
2Manufacturing precision
If pressing-up force is applied to align sample plates, then the alignment precision is improved, but the device complexity increases
Solution Approach 1:
The pressing-up mechanism is segmented into multiple independent pressing-up elements distributed across the holder. Each element operates independently to press down on sample plates at different locations, simplifying the overall control while achieving precise alignment across the entire sample plate array.
Solution Approach 2:
The pressing-up elements are designed to automatically adjust and apply appropriate pressing force based on the sample plate thickness without requiring external intervention or complex control systems. This self-adjusting capability reduces device complexity while maintaining alignment precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables stable alignment and simultaneous observation of multiple samples with minimal focus adjustments, regardless of plate thickness, facilitating efficient and accurate microscopic analysis.
Implementation Method 1
a first pressing-up element array provided in the storage space on one side in a y direction orthogonal to the x direction, and formed from a plurality of pressing-up elements arranged in the x direction; a second pressing-up element array provided in the storage space on the other side in the y direction, and formed from a plurality of pressing-up elements arranged in the x direction
Data Source
AI summary
A first spring array and a second spring array are provided in a holder body. Three sample plates can be mounted in the holder body. On each sample plate, pressing-up forces from the first spring array and the second spring array are applied, but upward movement of each sample plate is restricted by an inner surface of a cover.