Semi-insulating Compound Semiconductor Substrate Uniformity

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Solution Overview

Problem

Current semi-insulating compound semiconductor substrates lack uniform microdistribution of specific resistance across all crystal orientations, leading to non-uniform micro flatness and affecting device performance, especially in miniaturized structures.

Innovation Solution

A semi-insulating compound semiconductor substrate with a (100) plane orientation is developed, where the standard deviation of specific resistance is controlled to be no more than 0.1 mm in all directions, achieved by reducing dislocation density through a crystal growth method that manages thermal stress and crystal growth orientation, using a cylindrical crucible with alternating heat-insulating materials.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional crystal growth methods are used, then production efficiency is maintained, but uniform microdistribution of specific resistance is not achieved

Engineering Contradiction:
Improveuniformity of specific resistanceVSAvoidcrystal growth efficiency
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent applies parameter changes by precisely controlling crystal growth parameters including temperature gradient (maintaining specific gradient directions), growth rate, and atmospheric conditions during the vertical boat method process. These parameter adjustments ensure uniform specific resistance distribution while maintaining production efficiency

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent implements local quality control by managing thermal fields and stress distributions at different locations within the crystal growth zone. The alternating heating and cooling zones create localized temperature gradients that promote uniform dislocation distribution throughout the crystal structure

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If dislocation density is reduced to improve uniformity, then manufacturing precision improves, but crystal growth complexity increases

Engineering Contradiction:
Improvemicro flatness uniformityVSAvoidcrystal growth process complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent applies segmentation by dividing the crystal growth process into distinct zones with alternating heating and cooling functions. The crucible is segmented into multiple thermal zones that can be independently controlled, allowing precise management of temperature gradients and stress distribution to reduce dislocations

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent uses an intermediary thermal field created by alternating heating and cooling zones as a mediator to control dislocation formation. This thermal intermediary indirectly manages crystal structure uniformity by controlling the growth environment rather than directly manipulating the crystal lattice

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach results in a substrate with uniform microdistribution of specific resistance, enhancing micro flatness and enabling high-quality, high-performance devices by minimizing dislocation density and maintaining stable crystal growth.

Implementation Method 1

reducing dislocation density through a crystal growth method that manages thermal stress

Methodology Applied
Scientific EffectThermal stress: Thermal Expansion

Implementation Method 2

cylindrical crucible with alternating heat-insulating materials

Methodology Applied
Scientific EffectHeat insulation: Thermal Insulation

Data Source

PatentUS10971374B2Semi-insulating compound semiconductor substrate and semi-insulating compound semiconductor single crystal
Publication Date: 2021.04.06 SUMITOMO ELECTRIC INDUSTRIES LTD
  • US10971374B2 patent drawing
  • US10971374B2 patent drawing

AI summary

A semi-insulating compound semiconductor substrate includes a semi-insulating compound semiconductor, the semi-insulating compound semiconductor substrate being configured such that, on a major plane having a plane orientation of (100), a standard deviation/average value of specific resistance measured at intervals of 0.1 mm along equivalent four directions in a <110> direction from a center of the major plane, and a standard deviation/average value of specific resistance measured at intervals of 0.1 mm along equivalent four directions in a <100> direction from the center of the major plane are each not more than 0.1.