Semi-Circular Probe Card for Backplane Signal Testing

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Solution Overview

Problem

Current methods for testing and characterizing high-speed serdes interfaces on printed circuit boards require human intervention, leading to inaccurate measurements, potential damage to components, and increased costs due to the need for manual connection and disconnection of probes, which complicates the process and increases the risk of errors.

Innovation Solution

A semi-circular probe card with mechanical features that allows for incremental positioning and connection/disconnection without human intervention, providing symmetric and robust probing points for accurate electrical performance testing across various backplane configurations, reducing the impact of human error and minimizing damage to components.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If manual connection and disconnection of probes is used for testing, then flexibility in testing setup is maintained, but measurement accuracy deteriorates and risk of component damage increases

Engineering Contradiction:

Improveflexibility in testing setupVSAvoidmeasurement accuracy

Core Design Contradiction:

Ease of operationVSMeasurement precision

Solution Approach 1:

The probe card system performs self-positioning and self-connection through mechanical features such as alignment pins, guide slots, and spring-loaded contact points. The system automatically engages with the backplane connector without requiring manual alignment or connection, eliminating human error while maintaining operational flexibility through programmable positioning capabilities.

Inventive Principle:

Principle #25Self-service

Solution Approach 2:

Manual mechanical probe connection is replaced with an automated probe card system that uses mechanical guides and alignment features to automatically position and connect probes to test points. The system substitutes human-operated mechanical manipulation with automated mechanical positioning and contact establishment.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

2Adaptability or versatility

If manual probe connection is used, then adaptability to different test configurations is maintained, but time consumption and cost increase

Engineering Contradiction:

Improveadaptability to different test configurationsVSAvoidtime consumption

Core Design Contradiction:

Adaptability or versatilityVSLoss of time

Solution Approach 1:

The probe card system incorporates programmable positioning mechanisms that can dynamically adjust probe positions and test configurations based on stored test patterns. The system can be reprogrammed for different test scenarios without manual reconfiguration, enabling rapid adaptation to various test configurations while significantly reducing setup time.

Inventive Principle:

Principle #15Dynamics

Solution Approach 2:

Test configurations and probe positions are pre-programmed into the system before actual testing begins. The probe card system stores multiple test patterns and positioning sequences that can be automatically executed, eliminating the need for manual reconfiguration when switching between different test scenarios.

Inventive Principle:

Principle #10Preliminary action

3Ease of operation

If repeated manual connection and disconnection is performed, then testing flexibility is maintained, but component reliability deteriorates due to potential damage

Engineering Contradiction:

Improvetesting flexibilityVSAvoidcomponent integrity

Core Design Contradiction:

Ease of operationVSReliability

Solution Approach 1:

The probe card system automatically manages connection and disconnection sequences through programmable control, eliminating repeated manual handling that causes wear and damage. The system uses controlled mechanical engagement with spring-loaded contacts and guided positioning to ensure consistent, damage-free connections during automated testing cycles.

Inventive Principle:

Principle #25Self-service

Solution Approach 2:

The probe card system incorporates mechanical cushioning elements such as spring-loaded contact points and compliant positioning features that absorb mechanical stresses during connection and disconnection. These pre-designed protective features prevent damage to both the probe card and the backplane connector during repeated testing operations.

Inventive Principle:

Principle #11Beforehand cushioning (Prior cushioning)

4Measurement precision

If automated probe card system is implemented, then measurement accuracy and component protection improve, but device complexity increases

Engineering Contradiction:

Improvemeasurement accuracyVSAvoidsystem complexity

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The automated probe card system is divided into distinct functional modules including positioning mechanisms, probe arrays, mechanical guides, and control systems. Each module performs a specific function and can be independently designed and maintained, reducing overall system complexity while maintaining measurement accuracy and automated operation.

Inventive Principle:

Principle #1Segmentation

Data Source

PatentUS9921262B2Method and apparatus for a probe card

Publication Date: 2018.03.20 ELMA ELECTRONIC

AI summary

An integrated apparatus and method to provide test, diagnostics and characterization access to backplane electrical signals during electronic product development is presented. The apparatus removes need for manual and ad hoc connections made in an engineering laboratory or assembly line which make the process prone to damage of the components, inaccurate measurements and arbitrary fluctuations in function. The method and apparatus is a mechanized way to connect backplane signals to corresponding drivers, receivers and test equipment through probes placed on equidistant electrical traces, reducing inter signal variations.