Photosensitive Semiconductor Aperture Light Beam Testing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing optical systems for testing diffraction or diffusion of light beams lack efficient methods to detect abnormalities in the angular spread and intensity of light beams, which can lead to ineffective depth mapping or illumination, and potential damage to optical components.
Innovation Solution
A compact apparatus comprising a photosensitive semiconductor with an aperture and coupled anodes and cathodes, combined with an optical element such as a diffractive optical element (DOE) or diffuser, detects electric currents generated by internally scattered or diffracted light, allowing for real-time monitoring and control of the light source to prevent damage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If existing optical testing systems are used to detect abnormalities in light beam angular spread and intensity, then measurement capability is provided, but the systems are complex and deflect or attenuate useful light
Solution Approach 1:
The patent combines the optical element (DOE or diffuser) with the light source into a single integrated unit. The optical element is positioned within the light source housing, and the photosensitive semiconductor is integrated into the same structure, eliminating the need for separate testing apparatus and reducing system complexity while maintaining measurement precision.
Solution Approach 2:
The optical element serves dual functions: it performs its primary function of modifying the light beam for illumination or depth mapping, and simultaneously enables testing of light beam abnormalities through the integrated photosensitive semiconductor detector. This multi-functionality eliminates the need for separate testing systems.
2Measurement precision
If existing optical testing systems are used to detect light beam abnormalities, then detection capability is achieved, but useful light is deflected or attenuated
Solution Approach 1:
The photosensitive semiconductor is positioned to detect only specific portions of the light beam that have been modified by the optical element. The detector monitors localized areas where scattered or diffracted light exits the optical element, allowing abnormality detection without requiring attenuation of the main useful light beam.
Solution Approach 2:
The optical element acts as an intermediary that separates the useful light path from the testing path. It modifies the light beam to create a testable portion while maintaining the primary beam for illumination, allowing simultaneous operation without light loss.
3Reliability
If real-time monitoring of light source is implemented to prevent damage, then reliability is improved, but device complexity increases
Solution Approach 1:
The monitoring function is merged with the primary optical system by integrating the photosensitive semiconductor detector within the light source housing. This eliminates the need for separate monitoring apparatus and reduces overall system complexity while providing continuous real-time protection.
Solution Approach 2:
The integrated detector provides continuous feedback on light beam characteristics to the control circuit, which automatically adjusts or shuts off the light source when abnormalities are detected. This closed-loop feedback system ensures reliable operation with minimal additional complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables continuous testing of light beam properties without deflecting or attenuating useful light, ensuring the optical element functions correctly and preventing damage, while maintaining a compact system design.
Implementation Method 1
A diffractive optical element (DOE) is mounted in the package so as to receive and diffract the radiation from the radiation source into a predefined pattern comprising multiple diffraction orders
Implementation Method 2
an optical element, configured to modify an angular spread of a light beam that traverses the optical element
Implementation Method 3
A photosensitive semiconductor, shaped to define an aperture... detects electric currents that pass between the cathodes and the anode in response to a portion of the light beam exiting the optical element and hitting the semiconductor
Data Source
AI summary
An apparatus for testing diffraction or diffusion of a light beam is provided. The apparatus includes a photosensitive semiconductor, shaped to define an aperture. At least one anode, and a plurality of cathodes, are coupled to the semiconductor. An optical element, configured to modify an angular spread of a light beam that traverses the optical element, is disposed within the aperture. A detector is configured to detect electric currents that pass between the cathodes and the anode in response to a portion of the light beam exiting the optical element and hitting the semiconductor. Other embodiments are also described.