Semiconductor Package Apertures for Void Reduction

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

The existing semiconductor packaging processes often result in voids and defects due to trapped flux residues during the molding process, which affect the reliability and yield of semiconductor packages.

Innovation Solution

Incorporating apertures or slots between substrates to facilitate the outflow of materials from cavities, aligned with removable regions, which are subsequently removed during the singulation process to minimize defects and voids in the encapsulation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If traditional molding process is used without apertures, then complete encapsulation is achieved, but voids and defects form due to trapped flux residues

Engineering Contradiction:
Improvedevice reliabilityVSAvoidencapsulation quality
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The substrate is segmented by forming apertures or slots that divide the encapsulation cavity into regions with controlled material flow paths. This segmentation allows flux residues to escape through designated channels while maintaining encapsulation integrity, resolving the contradiction between complete encapsulation and void prevention

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The aperture acts as an intermediary element between the encapsulation cavity and the external environment. It provides a controlled pathway for flux residues to escape during molding while preventing premature exposure of sensitive components, enabling both complete encapsulation and defect mitigation

Inventive Principle:
Principle #24Intermediary (Mediator)

2Manufacturing precision

If apertures are formed in substrates, then outflow of materials is facilitated reducing voids, but additional manufacturing steps are required

Engineering Contradiction:
Improveencapsulation qualityVSAvoidprocess complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The aperture formation step is merged with the substrate preparation process by using the same routing and drilling infrastructure already present in PCB manufacturing. This integration minimizes additional process complexity while achieving the benefit of improved encapsulation quality

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The aperture structure serves multiple functions: it facilitates material outflow during molding, provides alignment references for stacking, and can be used for subsequent wire bonding or testing. This multi-functionality justifies the added manufacturing step by delivering multiple benefits from a single feature

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Manufacturing precision

If apertures and removable regions are removed during singulation, then defect-free packages are produced, but simultaneous precise removal is required

Engineering Contradiction:
Improvepackage qualityVSAvoidsingulation difficulty
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The aperture and removable region are designed with pre-defined geometries and locations that align with standard singulation patterns. This preliminary configuration allows the singulation process to remove these features automatically along with the substrate, eliminating the need for separate removal steps while maintaining precision

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS9184067B1Methods of mitigating defects for semiconductor packages
Publication Date: 2015.11.10 STATS CHIPPAC MANAGEMENT PTE LTD
  • US9184067B1 patent drawing
  • US9184067B1 patent drawing
  • US9184067B1 patent drawing

AI summary

Semiconductor packages with multiple substrates can incorporate apertures or slots between devices to minimize or reduce formation of defects during a molding process. The apertures or slots can be formed adjacent a top substrate in alignment with removable regions adjacent a bottom substrate whereby the apertures or slots can facilitate outflow of materials from cavities between the substrates. The apertures or slots may subsequently be removed in conjunction with the removable regions during a singulation process thereby producing the desired semiconductor packages with improved device reliability and yield.