Semiconductor Device for Accurate Battery Temperature Measurement
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Solution Overview
Problem
Conventional semiconductor devices with limited functions struggle to achieve accurate temperature measurement due to increased circuit scale and cost, particularly when minimizing the influence of variance in the power source voltage applied to thermistors.
Innovation Solution
A semiconductor device with a simple configuration, including a voltage generation circuit, analog/digital conversion circuit, and storage unit, which generates a specific voltage, converts temperature-sensitive voltage to digital values, and stores these values for external calculation, allowing accurate temperature measurement without the need for complex calculation circuits or large memory.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a conventional semiconductor device with limited functions is used, then the circuit scale is minimized and cost is reduced, but measurement precision of temperature is deteriorated due to increased influence of power source voltage variance
Solution Approach 1:
The patent divides the temperature measurement system into two functional parts: a simple semiconductor device that only performs A/D conversion and stores digital values, and an external device that performs the complex calculation to determine temperature. This segmentation allows the semiconductor device to maintain minimal circuit scale while the overall system achieves high measurement precision through the external calculation process that compensates for power source voltage variance.
Solution Approach 2:
The patent introduces digital values as an intermediary between the semiconductor device and the external calculation device. The A/D conversion circuit converts the thermistor voltage to digital values that are stored in memory, serving as a mediator that transfers measurement data without requiring the semiconductor device to perform complex temperature calculation, thus maintaining simple circuitry while enabling precise temperature measurement through external processing.
2Measurement precision
If a conventional semiconductor device with limited functions is used, then the device complexity is minimized, but measurement precision is deteriorated due to increased influence of power source voltage variance
Solution Approach 1:
The patent segments the temperature measurement functionality such that the semiconductor device only contains essential components (A/D conversion circuit and memory) while the complex calculation function is moved to an external device. This segmentation simplifies the manufacturing process of the semiconductor device by reducing circuit complexity, while the overall system maintains high measurement precision through the external calculation that compensates for power source voltage variations.
3Measurement precision
If the circuit scale is minimized in a semiconductor device, then manufacturing cost is reduced, but measurement precision deteriorates due to inability to compensate for power source voltage variance
Solution Approach 1:
The patent extracts the complex calculation function from the semiconductor device and places it in an external device. The semiconductor device retains only the essential A/D conversion circuit and memory for storing digital values, minimizing the quantity of circuit components. The extracted calculation function, which compensates for power source voltage variance, is performed externally, allowing the semiconductor device to maintain minimal component count while the system as a whole achieves high measurement precision.
4Measurement precision
If a simple configuration is used in a semiconductor device, then device complexity is minimized, but measurement precision deteriorates due to increased influence of power source voltage variance
Solution Approach 1:
The patent segments the temperature measurement configuration into a simple semiconductor device portion (A/D conversion and storage) and an external calculation portion. This segmentation allows the semiconductor device to maintain a simple configuration with minimal circuit complexity, while the overall system achieves high measurement precision through the external device's calculation that compensates for power source voltage variance.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables high-accuracy temperature measurement in a compact and cost-effective manner, minimizing measurement errors caused by power source voltage variance, while maintaining a minimal circuit scale suitable for battery monitoring applications.
Implementation Method 1
a temperature sensitive element (a thermistor) and a voltage dividing resistor
Data Source
AI summary
A semiconductor device includes a voltage generation circuit configured to generate a specific voltage; a first terminal configured to output the specific voltage; a second terminal configured to receive a temperature sensitive voltage; an analog/digital conversion circuit configured to convert the specific voltage and the temperature sensitive voltage to digital values; a storage unit configured to store the specific voltage and the temperature sensitive voltage; and a third terminal configured to transmit the specific voltage and the temperature sensitive voltage to an external semiconductor device.


