Semiconductor Package Bump Pads With Trench Portions

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Solution Overview

Problem

The increasing demand for compact and multifunctional semiconductor devices with fine-pitch connection structures poses challenges in ensuring reliable electrical connections, as smaller solder balls are prone to poor bonding and damage from external stress.

Innovation Solution

The semiconductor package design includes a semiconductor chip with a chip pad, an insulating layer, a redistribution pattern, and an external bump pad with trench portions, where the external connector contacts the insulating layer through these trenches, increasing the contact area and enhancing bonding during the solder-ball attach process.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the size of solder ball is decreased to achieve fine-pitch connection, then the connection density is improved, but the bonding reliability deteriorates and the solder ball becomes easily damaged by external stress

Engineering Contradiction:
Improveconnection densityVSAvoidbonding reliability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent introduces a trench structure that extends vertically into the bump pad, adding a depth dimension to the connection interface. This allows the external connector to contact the bump pad at multiple levels (surface and trench bottom), effectively increasing the contact area without increasing the planar footprint, thereby maintaining fine-pitch density while improving bonding reliability

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The bump pad is segmented by the trench structure, creating distinct contact zones: the trench portion and the remaining bump pad surface. The external connector is positioned to contact both the trench portion and the insulating layer, creating multiple contact points that distribute stress and improve overall connection reliability

Inventive Principle:
Principle #1Segmentation

2Reliability

If the contact area between external connector and bump pad is increased to improve bonding reliability, then the joint strength is improved, but the device complexity increases

Engineering Contradiction:
Improvejoint reliabilityVSAvoidstructure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

Instead of increasing the planar contact area which would require larger pitch, the patent utilizes the vertical dimension by etching trenches into the bump pad. This allows the external connector to access deeper regions of the bump pad through the trench, increasing effective contact area while maintaining the same planar footprint and avoiding increased device complexity

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS11177199B2Semiconductor packages with external bump pads having trench portions and semiconductor modules including the semiconductor packages
Publication Date: 2021.11.16 SAMSUNG ELECTRONICS CO LTD
  • US11177199B2 patent drawing
  • US11177199B2 patent drawing
  • US11177199B2 patent drawing

AI summary

A semiconductor package includes a semiconductor chip including a chip pad and an external bump pad electrically connected to the chip pad of the semiconductor chip. The external bump pad may include a trench portion extending from a perimeter surface of the external bump pad toward a center of the external bump pad. The semiconductor package includes an external connector on the external bump pad, with the external connector including a portion that is in the trench portion of the external bump pad.