Semiconductor Capacitor Finger Electrode Alignment

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Solution Overview

Problem

Semiconductor capacitors in integrated circuits suffer from mismatch issues due to sensitivity to fabrication processes and structure design, affecting the accuracy of digital signals.

Innovation Solution

The semiconductor structure features capacitors with finger electrodes and connecting lines arranged in specific patterns, where the connecting lines are parallel to each other, improving reliability and reducing mismatch without impacting capacitor performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If non-parallel connecting lines are used to connect finger electrodes, then device complexity is reduced, but reliability deteriorates and mismatch performance worsens

Engineering Contradiction:
Improvecapacitor reliabilityVSAvoidconnecting line arrangement complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies homogeneity by making all connecting lines parallel to each other and to the finger electrodes. This uniform arrangement ensures consistent electrical characteristics across all capacitors, improving reliability and reducing mismatch without significantly increasing design complexity.

Inventive Principle:
Principle #33Homogeneity

2Manufacturing precision

If non-parallel connecting lines are used, then manufacturing is easier, but manufacturing precision deteriorates

Engineering Contradiction:
Improvecapacitor mismatch performanceVSAvoidconnecting line fabrication complexity
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The patent changes the geometric parameter of connecting lines from non-parallel to parallel arrangements. This parameter change ensures that all connecting lines have identical lengths and orientations, improving manufacturing precision and reducing capacitor mismatch while maintaining ease of fabrication through standardized patterns.

Inventive Principle:
Principle #35Parameter changes

3Measurement precision

If parallel connecting lines are used, then capacitor mismatch performance is improved, but device complexity increases

Engineering Contradiction:
Improvecapacitor mismatch performanceVSAvoidconnecting line arrangement complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the connecting lines into multiple parallel individual lines, each connecting to specific finger electrodes. This segmentation allows for precise control of electrical characteristics while maintaining simplicity through the repetitive parallel pattern, improving mismatch performance without excessive complexity.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS9041155B2Semiconductor structure
Publication Date: 2015.05.26 MARLIN SEMICON LTD
  • US9041155B2 patent drawing
  • US9041155B2 patent drawing
  • US9041155B2 patent drawing

AI summary

A semiconductor structure includes a first capacitor and a second capacitor. The first capacitor includes a plurality of first units and each first unit includes a plurality of first finger electrodes. The second capacitor includes a plurality of second units and each second unit includes a plurality of second finger electrodes. The first units and the second units are alternately arranged to form an array. The semiconductor structure further includes a plurality of first connecting lines and a plurality of second connecting lines being parallel with each other. The first connecting lines are electrically connected to the first finger electrodes, and the second connecting lines are electrically connected to the second finger electrodes. The first finger electrodes and its adjacent first connecting lines form a straight line, and the second finger electrodes and its adjacent second connecting lines form another straight line.