Semiconductor Device Capacitor Stacking for Integration Density

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

The increasing demand for smaller integrated circuits requires reducing the size of components and adjusting their configuration on circuit substrates, particularly in forming capacitors, where existing technologies struggle to minimize component size effectively.

Innovation Solution

A semiconductor device is manufactured with a substrate, well region, isolation regions, dielectric layer, conductive layer, doped region, insulating layer, and contact vias, where the dielectric layer is formed between isolation regions, and conductive and doped regions are electrically connected via contact vias, allowing for reduced component size by optimizing the overlapping area between the conductive and dielectric layers.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If the distance between components is shortened to reduce integrated circuit size, then the size of integrated circuits is reduced effectively, but the manufacturing precision and component reliability may deteriorate

Engineering Contradiction:
Improveintegrated circuit sizeVSAvoidcomponent fabrication precision
Core Design Contradiction:
Area of stationary objectVSManufacturing precision

Solution Approach 1:

The patent transitions from planar capacitor structures to three-dimensional stacked capacitor structures. By forming multiple capacitor stacks vertically on the substrate with different orientations (first capacitor stacks extending in first direction, second capacitor stacks extending in second direction), the design utilizes the vertical dimension to increase capacitance density without increasing lateral footprint, thereby reducing overall circuit size while maintaining manufacturable dimensions

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent divides the capacitor structure into multiple discrete capacitor stacks arranged in different orientations. The first capacitor stacks extend in a first direction while second capacitor stacks extend in a second direction, creating segmented functional units that can be independently formed and controlled. This segmentation allows for better process control and reduced interference between adjacent structures

Inventive Principle:
Principle #1Segmentation

2Productivity

If component size is reduced to increase integration density, then more elements can be placed on substrate, but the device complexity and process difficulty increase

Engineering Contradiction:
Improveintegration densityVSAvoidcapacitor structure complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent employs a universal mandrel structure that serves multiple functions: it defines the footprint for capacitors, provides a template for forming both first and second capacitor stacks in different orientations, and enables systematic formation of multiple capacitor units. The same mandrel formation process is used repeatedly to create the pattern for both orientations of capacitor stacks, reducing process complexity despite increased structural diversity

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent implements a hierarchical structure where capacitor stacks are nested within defined footprints on the substrate. Multiple capacitor stacks of different orientations are arranged within the same lateral footprint area, creating a nested configuration that maximizes space utilization. The insulating layers and conductive plates are nested in alternating sequences within each capacitor stack

Inventive Principle:
Principle #7Nested doll (Nesting)

Data Source

PatentUS10680120B2Semiconductor device and method for manufacturing the same
Publication Date: 2020.06.09 VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION
  • US10680120B2 patent drawing
  • US10680120B2 patent drawing
  • US10680120B2 patent drawing

AI summary

A semiconductor device includes a substrate, a well region formed in the substrate, first and second isolation regions formed in the substrate, a dielectric layer formed on the well region, a conductive layer formed on the dielectric layer, a first doped region, an insulating layer, and first and second contact vias. The dielectric layer is disposed between the first and second isolation regions. The first doped region is formed in the well region. The insulating layer is formed on the dielectric layer, the first and second isolation regions, and the first doped region. The first contact via is formed in the insulating layer and electrically connected to the conductive layer. The first contact via is disposed on an overlapping area between the dielectric layer and the conductive layer. The second contact via is formed in the insulating layer and electrically connected to the doped region.