Semiconductor Test Circuit for External Capacitor Connection Inspection

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Solution Overview

Problem

The existing semiconductor devices with external capacitors for stabilizing power supply voltage variations are difficult to inspect for proper connection, as poor connections are visually indistinguishable, leading to potential shipment issues.

Innovation Solution

A semiconductor device with a test circuit that stops the regulator's operation and discharges an externally connected capacitor by connecting the first line to a predetermined potential, measuring the discharge duration, and outputting a test result signal to determine if the capacitor is properly connected based on a reference discharge duration.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Stability of the object's composition

If a capacitor is externally connected to the terminal to reduce power supply voltage variations, then the stability of power supply voltage is improved, but the ability to detect connection quality deteriorates because poor connections are visually indistinguishable

Engineering Contradiction:
Improvestability of power supply voltageVSAvoiddifficulty of detecting connection quality
Core Design Contradiction:
Stability of the object's compositionVSDifficulty of detecting and measuring

Solution Approach 1:

The test circuit performs a discharge test before shipment to preliminarily detect connection quality. The test executes a discharge operation on the capacitor through the external terminal and measures the discharge duration, enabling detection of poor connections before the product is shipped, thus resolving the contradiction between maintaining capacitor connection and enabling quality detection.

Inventive Principle:
Principle #10Preliminary action

2Ease of operation

If visual inspection is used to check capacitor connection, then the inspection process is simple, but the detection precision deteriorates because poor connections cannot be visually identified

Engineering Contradiction:
Improvesimplicity of inspection processVSAvoidprecision of connection detection
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The manual visual inspection method is replaced with an automated electrical discharge test. The test circuit applies voltage to the capacitor, measures the discharge duration through timing circuits, and automatically determines connection quality based on measured values, thus resolving the contradiction between inspection simplicity and detection precision.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables effective inspection of the capacitor's connection state before shipment, ensuring that capacitors with predetermined capacitance are correctly connected, thereby preventing potential product issues during operation.

Implementation Method 1

a capacitor to reduce variations in power supply voltage generated by a regulator

Methodology Applied
Scientific EffectCapacitance: Capacitance

Implementation Method 2

the capacitor has a poor connection to the external terminal in a state that the capacitor is present in the position of the external terminal

Methodology Applied
Scientific EffectElectrical energy storage and discharge: Electrical Accumulator

Data Source

PatentUS10755796B2Semiconductor device and electronic device
Publication Date: 2020.08.25 LAPIS SEMICON CO LTD
  • US10755796B2 patent drawing
  • US10755796B2 patent drawing
  • US10755796B2 patent drawing

AI summary

Provided is a semiconductor device including a regulator that generates a first voltage and applying the first voltage to a first line; an external terminal that is connected to the first line and externally connects an external component; and a test circuit that inspects a connection state of the external component. The test circuit includes a test discharge execution unit that is configured, upon receiving a test start signal, to stop the operation of the regulator and discharge the external component by connecting the first line to a predetermined potential; and a discharge duration measurement unit that measures a time required from the reception of the test start signal to a drop of the voltage of the first line below a predetermined second voltage, as a discharge duration of the component, and generate discharge duration information about the discharge duration.