Semiconductor Device Channel Layer Asymmetry for Memory Integration

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Solution Overview

Problem

Current semiconductor devices face challenges in achieving high integration density of three-dimensional memory cell arrays due to limitations in the arrangement and structure of channel layers and stack structures, which affect the efficiency and density of memory cell placement.

Innovation Solution

The semiconductor device incorporates a cell stack structure with first and second channel layers penetrating the stack structure, where the second channel layers overlap with the first channel layers and are biased to one side, allowing for a dense arrangement and improved integration by forming slits that isolate upper stack structures and channel layers, optimizing the placement of memory cells.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If channel layers are arranged in a conventional grid pattern, then the structure is simple to manufacture, but the integration density of memory cells is limited

Engineering Contradiction:
Improveintegration density of memory cellsVSAvoidarrangement structure of channel layers
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent applies asymmetry by offsetting the second channel layers relative to the first channel layers. Specifically, the second channel layers are positioned to overlap only partially with the first channel layers, creating an asymmetric arrangement that increases the number of memory cells per unit area while maintaining manufacturability through standardized fabrication processes

Inventive Principle:
Principle #4Asymmetry

2Manufacturing precision

If upper stack structures are continuously arranged without isolation, then the manufacturing process is simpler, but the control over channel layer positioning and electrical isolation is reduced

Engineering Contradiction:
Improvepositioning precision of channel layersVSAvoidstructure of upper stack structures
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent applies segmentation by introducing upper slits that divide the upper stack structures into isolated segments. These slits create physical and electrical isolation between adjacent upper stack structures, enabling precise positioning control of channel layers while maintaining manageable manufacturing complexity through modular structure design

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS9859293B2Semiconductor device and manufacturing method thereof
Publication Date: 2018.01.02 SK HYNIX INC
  • US9859293B2 patent drawing
  • US9859293B2 patent drawing
  • US9859293B2 patent drawing

AI summary

A semiconductor device includes a second channel layer in a first column and a second channel layer in a second column disposed biased to one side of a first channel layer in a first column and a first channel layer in a second column, respectively. The one side of the first channel layer in the first column and the one side of the first channel layer in the second column face directions opposite to each other.