Optoelectronic Semiconductor Chip Reflection-Enhancing Dielectric Layer
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Solution Overview
Problem
Optoelectronic semiconductor chips, such as LED chips, face absorption losses due to metallic connection layers, which reduce the efficiency of radiation emission.
Innovation Solution
Incorporating a reflection-enhancing dielectric layer sequence with alternating layers of different refractive indices between the semiconductor layers and metallic connection layers, along with transparent conductive layers, to reflect emitted radiation back into the semiconductor chip and reduce absorption losses.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If metallic connection layers are applied to the semiconductor layers for electrical contacting, then good electrical contact is achieved, but radiation absorption increases and efficiency decreases
Solution Approach 1:
A transparent dielectric layer is introduced as an intermediary between the metallic connection layer and the semiconductor layer. This intermediate layer has low absorption coefficient for the emitted radiation wavelength, allowing radiation to pass through with minimal absorption while still enabling electrical contact through the metallic layer.
Solution Approach 2:
The connection structure uses a composite of multiple materials: a metallic layer for electrical contact, a transparent dielectric layer for radiation transmission, and potentially a reflection-enhancing layer. This composite structure combines the advantages of each material while mitigating their individual disadvantages.
2Loss of energy
If a transparent dielectric layer is introduced between the metallic connection layer and semiconductor layer, then radiation absorption is reduced, but device structure becomes more complex
Solution Approach 1:
The transparent dielectric layer serves multiple functions simultaneously: it acts as a radiation transmission layer with low absorption, provides electrical insulation between the metallic connection layer and semiconductor, and can serve as an adhesion layer or stress relief layer. This multi-functionality reduces the need for additional separate layers.
3Loss of energy
If the metallic connection layer is made thinner to reduce absorption, then radiation transmission improves, but electrical contact quality deteriorates
Solution Approach 1:
The transparent dielectric layer acts as a mediator that allows the metallic connection layer to be optimized for electrical contact (adequate thickness for low contact resistance) while the dielectric layer ensures radiation transmission with minimal absorption. The dielectric layer compensates for the increased metallic layer thickness by providing a low-absorption path for radiation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enhances the efficiency of the optoelectronic semiconductor chip by minimizing radiation absorption in the metallic connection layers while maintaining good current spreading and electrical contact.
Implementation Method 1
a reflection-enhancing dielectric layer sequence is advantageously arranged between the p-doped semiconductor layer and the first metallic connection layer, which dielectric layer sequence includes a plurality of dielectric layers with different refractive indices. Radiation emitted from the active layer in the direction of the first metallic connection layer is advantageously reflected back at least in part by the reflection-enhancing dielectric layer sequence
Implementation Method 2
a reflection-enhancing dielectric layer sequence, which dielectric layer sequence includes a plurality of dielectric layers with different refractive indices
Data Source
AI summary
According to the present disclosure, optoelectronic semiconductor chip includes at least one n-doped semiconductor layer, at least one p-doped semiconductor layer and one active layer arranged between the at least one n-doped semiconductor layer and the at least one p-doped semiconductor layer. The p-doped semiconductor layer is electrically contacted by means of a first metallic connection layer, and a reflection-enhancing dielectric layer sequence is arranged between the p-doped semiconductor layer and the first connection layer, which dielectric layer sequence includes a plurality of dielectric layers with different refractive indices.


