Semiconductor Chip Temperature Sensing with Dynamic Control
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Solution Overview
Problem
Semiconductor chips face operational errors due to localized heat generation, which can lead to inaccurate temperature sensing when hotspots are not near the temperature sensor, causing improper operation or data loss.
Innovation Solution
A semiconductor system with a first chip generating temperature information using multiple temperature sensors and a second chip equipped with a temperature sensor that adjusts its operation based on this information, including a sensor activation block, voting block, compensation block, and internal control block to generate control signals for managing temperature measurement and internal operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single temperature sensor is used in a semiconductor chip, then the device complexity is reduced, but the measurement precision of temperature in hotspot regions deteriorates
Solution Approach 1:
The semiconductor chip is divided into multiple regions with different temperature characteristics, and temperature sensors are strategically placed in each region. This segmentation allows independent temperature monitoring of hotspot areas and non-hotspot areas, resolving the contradiction by enabling precise localized measurement without requiring a sensor throughout the entire chip.
Solution Approach 2:
Different regions of the chip are assigned different measurement priorities based on their thermal characteristics. Hotspot regions receive dedicated temperature sensors for precise monitoring, while non-hotspot regions use less intensive sensing approaches. This local quality differentiation optimizes measurement precision where needed while maintaining overall system simplicity.
2Measurement precision
If temperature sensors are placed in all hotspot regions, then the measurement precision is improved, but the device complexity increases
Solution Approach 1:
Temperature sensors are pre-positioned in predicted hotspot regions based on design-stage thermal analysis and simulation. This preliminary action identifies critical measurement locations before manufacturing, allowing precise temperature monitoring in likely hotspot areas without the need for exhaustive sensor placement throughout the chip.
Solution Approach 2:
Temperature sensor data from representative locations is used to infer temperature conditions in adjacent or similar regions. By placing sensors in strategically chosen representative positions, the system captures temperature information that can be extrapolated to cover broader areas, reducing the total number of sensors needed while maintaining measurement precision.
3Reliability
If temperature sensing is performed continuously, then the reliability of temperature monitoring is improved, but the use of energy increases
Solution Approach 1:
Temperature sensing is performed periodically rather than continuously, with the sensing interval dynamically adjusted based on operational conditions. During normal operation, sensing occurs at longer intervals to conserve energy, while during high-activity periods or when hotspots are detected, the sensing frequency increases to maintain reliability.
Solution Approach 2:
The temperature monitoring system dynamically adapts its operation based on real-time conditions. When temperature changes are detected or when the chip enters high-performance modes, the system increases monitoring intensity. During stable, low-power states, monitoring frequency is reduced, optimizing the balance between reliability and energy consumption.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Prevents erroneous operations by accurately measuring and managing temperature across the chip, ensuring optimal refresh intervals and preventing data loss in memory cells, even when hotspots are not near the temperature sensor.
Implementation Method 1
a second temperature sensor configured to measure a temperature in the second chip and generate second temperature information according to the measured temperature
Data Source
AI summary
In one example embodiment, a semiconductor system includes a first chip configured to generate first temperature information of the first chip, the first temperature information being based on at least one temperature measurement using at least one first temperature sensor. The semiconductor system further includes a second chip including a second temperature sensor configured to be controlled based on at least the first temperature information.


