Semiconductor Integrated Circuit Confidential Data Error Analysis

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Solution Overview

Problem

Conventional techniques for testing non-volatile devices in semiconductor integrated circuits cannot determine whether errors are in the confidential data or the check redundant data, and fail to specify the position of error occurrence without compromising confidentiality.

Innovation Solution

A semiconductor integrated circuit with a test circuit that uses check redundant data to compare computation results, encrypts data using a secret key when a mismatch is detected, and outputs the encrypted data for authorized analysis, maintaining confidentiality by ensuring only authorized testers can recover the original data.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If confidential data is output for error analysis, then error position can be specified, but confidentiality of confidential data is compromised

Engineering Contradiction:
Improveerror position specificationVSAvoidconfidentiality
Core Design Contradiction:
Measurement precisionVSLoss of information

Solution Approach 1:

The patent introduces an encryption circuit as an intermediary between the comparison circuit and the output. When a mismatch is detected, the encryption circuit encrypts the confidential data and check redundant data using a predetermined secret key before outputting them. This mediator allows error analysis while protecting confidentiality, as authorized personnel with the secret key can decrypt and analyze the data to specify error positions.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If conventional testing is performed, then testing can be executed, but error position cannot be specified

Engineering Contradiction:
Improvetesting capabilityVSAvoiderror position specification
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The patent segments the testing process into distinct functional blocks: a check computation circuit that computes check redundant data from confidential data, a comparison circuit that compares computed check redundant data with stored check redundant data, and an encryption circuit that encrypts data when mismatches are detected. This segmentation enables both reliable testing and precise error position specification by isolating the error detection function from the confidential data storage function.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS7913316B2Semiconductor integrated circuit and method for testing semiconductor integrated circuit
Publication Date: 2011.03.22 PANASONIC SEMICON SOLUTIONS CO LTD
  • US7913316B2 patent drawing
  • US7913316B2 patent drawing
  • US7913316B2 patent drawing

AI summary

A check computation circuit executes a computation corresponding to a computation for generating confidential CRC data, with respect to confidential data read from a non-volatile device. A comparison circuit compares the result of the computation in the check computation circuit with confidential CRC data read from the non-volatile device. When the result of the comparison indicates a mismatch, i.e., an error is detected, an encryption circuit encrypts the confidential data and the confidential CRC data using a secret key registered in a secret key register, and outputs the encrypted confidential data and confidential CRC data to the outside of a semiconductor integrated circuit.