Semiconductor Voltage Clamping Circuit Using Bipolar Transistor Vbe Difference

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Solution Overview

Problem

Conventional techniques for clamping the voltage of an n-type semiconductor region, such as using a Schottky diode, may not be available or can cause parasitic lateral NPN transistors to turn on due to high series resistance and forward voltage, leading to ineffective voltage clamping.

Innovation Solution

A clamping circuit utilizing a current mirror and bipolar transistors, where the difference in base-emitter junction voltages of these transistors defines the voltage at which the n-type region is clamped, without relying on Schottky transistors, and includes current limiting resistors to manage current flow and ensure proper startup.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a Schottky diode is used to clamp the n-type region voltage, then the voltage clamping function is provided, but the Schottky diode may not be available or may have high series resistance and forward voltage causing parasitic transistor activation

Engineering Contradiction:
Improvevoltage clamping reliabilityVSAvoidparasitic lateral NPN transistor activation
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The patent changes the clamping mechanism from relying on Schottky diode forward voltage to using the difference in base-emitter voltages of bipolar transistors. By utilizing the Vbe difference parameter (typically around 60mV at room temperature) instead of the Schottky forward voltage, the clamping voltage is precisely controlled without activating parasitic transistors. The clamping voltage is defined as Vclamp = Vbe(Q1) - Vbe(Q2), where Q1 and Q2 are bipolar transistors with carefully selected emitter areas to achieve the desired Vbe difference.

Inventive Principle:
Principle #35Parameter changes

2Loss of energy

If a current limiting resistor is placed between the n-type region and the node that may pull it below ground, then current limiting is provided, but the combination with Schottky diode still results in insufficient voltage clamping

Engineering Contradiction:
Improvecurrent limitingVSAvoidvoltage clamping effectiveness
Core Design Contradiction:
Loss of energyVSReliability

Solution Approach 1:

The patent introduces bipolar transistors Q1 and Q2 as intermediary elements between the n-type region and ground, replacing the direct Schottky diode connection. These transistors act as active mediators that precisely control the voltage at the n-type region through their base-emitter voltage characteristics, achieving reliable voltage clamping without the limitations of passive Schottky diode-resistor combinations.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Reliability

If Schottky diode with high forward voltage is used, then voltage clamping is provided, but the n-type region is clamped at voltage sufficiently below ground potential causing parasitic transistor to turn on

Engineering Contradiction:
Improvevoltage clamping functionVSAvoidparasitic transistor turn-on
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent fundamentally changes the voltage reference parameter from Schottky forward voltage (typically 0.3-0.5V) to the difference in bipolar transistor base-emitter voltages (typically 60mV). This parameter change enables precise control of the clamping voltage to be just above ground potential, preventing parasitic transistor activation while maintaining effective voltage clamping functionality.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Effectively clamps the voltage of an n-type semiconductor region at or near ground potential, preventing parasitic transistor activation and ensuring stable operation by controlling the voltage through the ratio of transistor areas and current mirroring, thus avoiding the limitations of Schottky diode-based systems.

Implementation Method 1

The difference between the base-emitter junction voltages of the first and second bipolar transistors defines the voltage at which the n-type region is clamped

Methodology Applied
Scientific EffectBase-emitter junction voltage: Diode

Implementation Method 2

The current mirror receives a first current and supplies a second current in response

Methodology Applied
Scientific EffectCurrent mirroring:

Data Source

PatentUS8159278B2Method for clamping a semiconductor region at or near ground
Publication Date: 2012.04.17 ANALOG DEVICES INT UNLTD CO
  • US8159278B2 patent drawing
  • US8159278B2 patent drawing
  • US8159278B2 patent drawing

AI summary

A clamping circuit clamps a voltage received by an n-type semiconductor region without using a Schottky transistor. The clamping circuit includes a current mirror as well as first and second bipolar transistors. The current mirror receives a first current and supplies a second current in response. The first current is received by the first bipolar transistor, and the second current is received by the second bipolar transistor. The difference between the base-emitter junction voltages of the first and second bipolar transistors, in part, defines the voltage at which the n-type region is clamped. To start-up the circuit properly, current is withdrawn from the base/gate terminals of the transistors disposed in the current mirror. The circuit optionally includes a pair of cross-coupled transistors to reduce the output impedance and improve the power supply rejection ratio.