Classifying Light-Emitting Semiconductor Components by Sensor-Specific RGB Parameters
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Solution Overview
Problem
Existing methods for classifying light-emitting semiconductor components for image sensor applications are inadequate, as they often require separate calibration for white balance due to different emission spectrums leading to varying raw data values, despite identical standard color values in the XYZ color space.
Innovation Solution
A method for classifying light-emitting semiconductor components based on parameters R, G, and B, which are determined by integrating the spectral sensitivities of the image sensor's color channels with the emission spectrum, allowing categorization into classes characterized by value ranges that define the image sensor color space, thereby standardizing the classification and avoiding the need for individual calibration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If light-emitting semiconductor components are classified using standard XYZ color space values, then color accuracy is maintained, but separate calibration is required for each component due to varying emission spectrums
Solution Approach 1:
The patent transforms the classification parameters from standard XYZ color space values to image sensor-specific parameters (R, G, B) derived by integrating the emission spectrum with the sensor's spectral sensitivities. This parameter transformation enables direct classification in the sensor's native color space, eliminating the need for separate white balance calibration while preserving color accuracy.
Solution Approach 2:
The patent introduces spectral sensitivity integration as an intermediary process that bridges the emission spectrum and the image sensor's color channels. By using this intermediary transformation, the classification system directly accounts for the sensor's specific spectral response characteristics, avoiding the calibration complexity that would otherwise be required.
2Measurement precision
If separate calibration is performed for each light-emitting semiconductor component, then color accuracy is maintained, but processing time and complexity increase
Solution Approach 1:
The patent performs preliminary classification of light-emitting semiconductor components by determining their R, G, and B parameters in the image sensor color space before actual image capture. This preliminary action groups components with similar spectral characteristics, enabling the use of standardized white balance settings for entire groups rather than requiring individual calibration for each component, thus reducing calibration time significantly.
Solution Approach 2:
By changing the classification parameters from standard color space values to sensor-specific integrated parameters, the system enables batch classification and grouping of components. This allows pre-determination of appropriate white balance settings for groups of components, eliminating the need for time-consuming individual calibration procedures.
3Reliability
If classification is based on integrated spectral parameters R, G, and B, then uniform raw data values are achieved across different sensors, but the classification system becomes more complex
Solution Approach 1:
The patent creates a universal classification system using R, G, and B parameters that can be applied across different image sensor types and applications. Although the calculation involves spectral integration, the resulting parameter system provides universal compatibility and uniform raw data values across sensors, enabling standardized processing pipelines that work reliably for all classified components.
4Ease of manufacture
If standard color space classification is used, then simplicity is maintained, but white balance adjustment requires separate calibration for each component
Solution Approach 1:
The patent changes the classification parameters to R, G, and B values that are directly integrated from the emission spectrum and sensor spectral sensitivities. This parameter change maintains classification simplicity while simultaneously eliminating calibration requirements, as the parameters are inherently tailored to the specific image sensor's color space characteristics.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables uniform raw data values across different image sensors, simplifying white balance adjustments and reducing the need for separate calibrations, while allowing tunable mixed spectrums to match various ambient light types.
Implementation Method 1
at least one of the following parameters of the light emitted during operation with the emission spectrum S(λ) by the light-emitting semiconductor component is determined: R=∫qR(λ)·S(λ)dλ·texp, G=∫qG(λ)·S(λ)dλ·texp, B=∫qB(λ)·S(λ)dλ·texp
Data Source
AI summary
The invention relates to a method for classifying a light-emitting semiconductor component (301) for an image sensor application, wherein the semiconductor component (301) is designed as a light source for an image sensor (302), comprising the following steps: providing the light-emitting semiconductor component (301); determining at least one of the following parameters of the light emitted with an emission spectrum by the light-emitting semiconductor component (301) during operation: R=∫qR(λ)·S(λ)dλ·texp, G=∫qG(λ)·S(λ)dλ·texp, B=∫qB(λ)·S(λ)dλ·texp, wherein qR(λ), qG(λ), and qB(λ) are spectral sensitivities of a red, green, and blue color channel of the image sensor (302), S(λ) is the emission spectrum of the light-emitting semiconductor component (301), texp is an exposure time, and λ designates a wavelength; classifying the light-emitting semiconductor component (301) into a class from a group of classes, which are characterized by different value ranges of at least one parameter that depends on at least one of the parameters R, G, and B. The invention further relates to an image sensor application.


