Semiconductor Clock Delay Control via Digital Timing Margin Measurement
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Solution Overview
Problem
Existing semiconductor technologies face challenges in accurately measuring phase shifts due to variations in Process-Voltage-Temperature (PVT) during miniaturization, leading to insufficient timing margins.
Innovation Solution
A semiconductor device with a communication device, a delay adder circuit, and a control circuit that adjusts the clock delay based on timing margin confirmations, using a CRC check circuit to directly measure the timing border for correct data extraction, thereby improving the accuracy of sampling clock delay.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If phase shift is measured by analog charge accumulation in capacitors, then measurement can be performed, but measurement precision is insufficient
Solution Approach 1:
The patent replaces the analog capacitor-based charge accumulation measurement system with a digital measurement system using a counter circuit that counts clock cycles. This substitution of measurement mechanism enables precise digital quantification of phase shift and timing margins, resolving the insufficiency of analog measurement precision while maintaining measurement capability.
Solution Approach 2:
The patent creates a digital copy of the timing relationship by counting clock cycles during the phase shift period. Instead of directly measuring analog charge levels, the system copies the timing information into digital form through cycle counting, enabling accurate representation and processing of phase shift data.
2Reliability
If timing margins are increased to compensate for PVT variations, then reliability improves, but device complexity increases
Solution Approach 1:
The patent implements a feedback control system where the measured timing margin (via clock cycle counting) is fed back to adjust the delay adder circuit. The control circuit dynamically adjusts the clock delay based on measured timing margins, enabling automatic optimization of timing margins without manual intervention or complex fixed structures, thus improving reliability while managing device complexity through adaptive control.
Solution Approach 2:
The patent introduces dynamic adjustment capability to the delay control system. Instead of fixed delay values, the system dynamically adapts delay settings based on real-time measurements of timing margins and PVT variations. This dynamic behavior allows the system to optimize timing margins adaptively, improving reliability without requiring overly complex static structures.
Data Source
AI summary
A technique capable of improving accuracy of an amount of delay of a sampling clock is provided. A semiconductor device includes: a communication device for wired communication; a delay adder circuit capable of adjusting an amount of delay of a clock to be received or transmitted by the communication device; and a control circuit controlling the amount of delay of the delay adder circuit. The communication device is configured to set a reception period or a transmission period of a normal frame and a reception period or a transmission period of a check frame in time division, and to confirm timing margins of setup and hold between data and a clock in the reception period or the transmission period of the check frame. The control circuit is configured to set the amount of delay in the normal frame, based on a confirmation result of the timing margins.