Semiconductor Conductive Layers Overlapping Field Oxide

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Solution Overview

Problem

Conventional integrated circuits face challenges with increased size and cost due to the use of metal wires for connecting electronic elements, which complicates the packaging process and raises costs.

Innovation Solution

A semiconductor structure is designed with a substrate, wells, doped regions, field oxide, and conductive and insulating layers, where the conductive layers form resistive paths to reduce the need for metal wires, allowing for a more compact and cost-effective integration of electronic elements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of moving object

If metal wires are used to connect electronic elements, then electrical connectivity is achieved, but the size of the integrated circuit increases

Engineering Contradiction:
Improvesize of integrated circuitVSAvoidpackaging complexity
Core Design Contradiction:
Area of moving objectVSEase of manufacture

Solution Approach 1:

The patent merges the functions of connection and resistance into a single integrated structure. The conductive layer serves dual purposes: providing electrical connectivity between elements and functioning as a resistive element, thereby eliminating the need for separate metal wire connections and reducing overall circuit size and packaging complexity

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent transitions from planar metal wire connections to a vertical stacked architecture where conductive layers are positioned at different heights. The first conductive layer is disposed over the field oxide at a first height, and the second conductive layer is disposed over the first conductive layer at a second height, utilizing the vertical dimension to reduce lateral space requirements

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Ease of manufacture

If metal wires are used to connect electronic elements, then electrical connectivity is achieved, but the cost of the integrated circuit increases

Engineering Contradiction:
Improvemanufacturing costVSAvoidpackaging process complexity
Core Design Contradiction:
Ease of manufactureVSDevice complexity

Solution Approach 1:

The patent combines multiple functions into the conductive layer structure, which serves as both interconnect and resistive element. This integration eliminates the need for separate packaging processes to attach metal wires, thereby reducing manufacturing cost and simplifying the packaging process while maintaining electrical connectivity

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent extracts the connection function from the traditional metal wire packaging process and integrates it directly into the semiconductor structure during fabrication. The conductive layers are formed as part of the device structure itself, removing the need for post-fabrication wire bonding and associated costs

Inventive Principle:
Principle #2Taking out (Extraction)

Data Source

PatentUS10262938B2Semiconductor structure having conductive layer overlapping field oxide
Publication Date: 2019.04.16 VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION
  • US10262938B2 patent drawing
  • US10262938B2 patent drawing
  • US10262938B2 patent drawing

AI summary

A semiconductor structure including a substrate, a first well, a first doped region, a second well, a second doped region, a field oxide, a first conductive layer, a first insulating layer and a second conductive layer is provided. Each of the substrate and the second well has a first conductivity type. The first and second wells are formed in the substrate. The first well has a second conductivity type. The first doped region is formed in the first well and has the second conductivity type. The second doped region is formed in the second well and has the first conductivity type. The field oxide is disposed on the substrate and is disposed between the first and second doped regions. The first conductive layer overlaps the field oxide. The first insulating layer overlaps the first conductive layer. The second conductive layer overlaps the first insulating layer.