Semiconductor Control Circuit Latch Testing
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Solution Overview
Problem
Conventional semiconductor integrated circuit devices lack the ability to obtain adjustment results and test performance of automatically adjusting circuits without influencing the adjusting circuit, limiting flexibility and reliability in operation.
Innovation Solution
Incorporating a control circuit to generate and output control codes, a latch circuit to store and transfer these codes, and an external output circuit to provide the codes to external units, allowing for independent monitoring and testing of adjustment results without disrupting the adjusting process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a latch circuit is connected between the control circuit and the predetermined circuit to latch the control code, then the adjustment result can be obtained at any time without influencing the adjusting circuit, but the device complexity increases
Solution Approach 1:
A latch circuit is introduced as an intermediary component between the control circuit and the predetermined circuit. This latch circuit stores the control code output from the control circuit and can be read at any time without affecting the control circuit's adjustment operations. The latch circuit acts as a buffer that decouples the reading operation from the control operation, enabling independent access to adjustment results while maintaining system reliability.
2Device complexity
If the control code is directly output from the control circuit to the predetermined circuit, then the device complexity is minimized, but the performance of the adjusting circuit cannot be tested at any time during operation
Solution Approach 1:
The latch circuit serves as a testing interface by storing control codes that can be externally read. This allows test equipment to access and verify the control codes at any time during the adjusting operation without interfering with the control circuit's normal function. The latch circuit provides a non-intrusive testing mechanism that enhances system adaptability and verification capability.
3Device complexity
If the latch circuit is connected through the same path as the control circuit to the predetermined circuit, then the device complexity is reduced, but the control code latching may interfere with the control signal transmission
Solution Approach 1:
The connection path is segmented into two separate paths: one path for control code transmission from the control circuit to the predetermined circuit, and another path for latching and reading the control code. This segmentation isolates the latch circuit's reading operations from the control signal transmission path, eliminating potential interference while maintaining access to control codes for testing and monitoring purposes.
Data Source
AI summary
A semiconductor integrated circuit device includes a control circuit configured to generate a control code to control a parameter of a predetermined circuit and outputs the control code to the predetermined circuit; and a latch circuit connected with an output of the control circuit to latch the control code in response to a control signal. The latch circuit may be provided between the control circuit and the predetermined circuit to latch the control code or transfer the control code to the predetermined circuit, in response to the control signal.