Optically Active Semiconductor Cooling Path Degradation Detection

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Solution Overview

Problem

Existing power electronic devices with switching-type semiconductor components face challenges in determining cooling path degradation, which can lead to component malfunction or failure, especially in applications like electric vehicles and solar installations, where proper cooling is critical.

Innovation Solution

A device with an optically active semiconductor structure that generates light dependent on temperature, combined with a brightness sensor to record and evaluate the light intensity, allowing for the determination of cooling path degradation without electrical isolation, featuring low construction volume and production costs, and enabling timely replacement of components.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If electrical isolation is used between measurement device and component, then safety is improved, but device complexity and construction volume increase

Engineering Contradiction:

ImprovesafetyVSAvoiddevice complexity

Core Design Contradiction:

ReliabilityVSDevice complexity

Solution Approach 1:

The patent replaces electrical isolation mechanisms with optical measurement. The semiconductor component's own luminescence is used as the measurement signal, which is inherently electrically isolated from the measurement device. This eliminates the need for additional electrical isolation components while maintaining safety and measurement capability.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The semiconductor component itself serves as the light source for measurement through its luminescence properties. The component's operational characteristics (luminescence intensity) provide the measurement signal, eliminating the need for separate excitation sources or complex isolation systems.

Inventive Principle:

Principle #25Self-service

2Reliability

If complex isolation systems are implemented, then safety is improved, but construction volume and production costs increase

Engineering Contradiction:

ImprovesafetyVSAvoidconstruction volume

Core Design Contradiction:

ReliabilityVSVolume of stationary object

Solution Approach 1:

Electrical isolation systems are replaced by optical measurement using the component's luminescence. The measurement device detects light signals from the component without electrical connection, achieving safety without additional isolation hardware and reducing construction volume.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If luminescence measurement is used for cooling path degradation detection, then measurement precision is improved, but device complexity increases

Engineering Contradiction:

Improvecooling path degradation detectionVSAvoiddevice complexity

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The semiconductor component's operational luminescence serves as the measurement signal. By monitoring changes in luminescence intensity or characteristics under known operating conditions, cooling path degradation is detected directly from the component's own emission, eliminating the need for separate sensors or complex measurement systems.

Inventive Principle:

Principle #25Self-service

Solution Approach 2:

The semiconductor component performs dual functions: power conversion and self-diagnosis. The same component that converts electrical energy also provides the luminescence signal for cooling path monitoring, eliminating the need for separate measurement devices and reducing overall system complexity.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution provides a fail-safe operation by accurately determining cooling path degradation, allowing for timely replacement and improving light efficiency, thus preventing component failure and ensuring reliable energy conversion.

Implementation Method 1

The semiconductor component includes an optically active semiconductor structure, which generates light having a brightness that is dependent on a temperature of the device when the semiconductor component is traversed by current

Methodology Applied

Scientific EffectLuminescence: Luminescence

Implementation Method 2

a brightness sensor for recording the brightness of the generated light

Methodology Applied

Scientific EffectPhotoelectric Effect: Photoelectric Effect

Data Source

PatentUS11269005B2Device for measuring a thermal degradation of the cooling path of power electronic components using luminescence

Publication Date: 2022.03.08 ROBERT BOSCH GMBH

AI summary

A device for converting electrical energy, including at least one switching-type semiconductor component, a cooling path for cooling the semiconductor component, and a device for determining a degradation of the cooling path based on a current having a predetermined current intensity that flows through the component. The device provides that the semiconductor component includes an optically active semiconductor material, which generates light having a brightness that is dependent on a temperature of the semiconductor component when the semiconductor component is traversed by current having a predetermined current intensity, and the device for determining the degradation includes a brightness sensor for recording the brightness of the generated light. The device has the advantage that the device for determining the degradation and the component are inherently galvanically isolated, and the degradation can be determined at a high resolution.