Semiconductor Error Detection via CRC Code Comparison

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Solution Overview

Problem

Data transmission errors occur between semiconductor devices due to noise in transmission lines, necessitating a method to detect and address errors in data transmission.

Innovation Solution

A semiconductor system that generates and compares error detection codes using cyclic redundancy check (CRC) logic to determine data transmission errors and outputs error address signals to a controller, enabling error detection and correction.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If error detection codes are generated and compared to detect data transmission errors, then data transmission reliability is improved, but device complexity increases due to additional error detection units and comparison logic

Engineering Contradiction:

Improvedata transmission reliabilityVSAvoiddevice complexity

Core Design Contradiction:

ReliabilityVSDevice complexity

Solution Approach 1:

The patent merges the error detection unit into the semiconductor circuit itself rather than having separate error detection devices. The error detection unit is integrated with the data input/output units, and the comparator is integrated into the controller, combining multiple functions into unified structures to reduce overall system complexity while maintaining reliability.

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The patent introduces error detection codes as intermediary elements that mediate between the transmitted data and the verification process. These codes are generated from the data, transmitted along with it, and then used by the comparator to verify data integrity, serving as a intermediary mechanism that enables error detection without requiring complex direct comparison of entire data sets.

Inventive Principle:

Principle #24Intermediary (Mediator)

2Measurement precision

If error address signals are output to identify specific error locations, then measurement precision is improved, but loss of time increases due to additional error analysis and signal output processes

Engineering Contradiction:

Improveerror detection precisionVSAvoidtest time

Core Design Contradiction:

Measurement precisionVSLoss of time

Solution Approach 1:

The patent performs preliminary error detection by continuously generating and comparing error detection codes during data transmission. The error detection unit operates in advance to identify errors before they propagate through the system, and the comparator is ready to immediately detect mismatches, enabling quick error identification without requiring extensive post-transmission analysis.

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The patent replaces manual or mechanical error detection methods with automated electronic error detection units and digital comparators. The error detection unit automatically generates codes from transmitted data, and the comparator electronically compares these codes with received data, substituting manual error checking processes with automated electronic systems that operate faster and more precisely.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

Data Source

PatentUS9239752B2Semiconductor system with error detection

Publication Date: 2016.01.19 SK HYNIX INC

AI summary

A semiconductor system including a semiconductor circuit configured to compare a first error detection code generated by performing an operation on read data to a second error detection code and determine a data transmission error, and a controller configured to provide the second error detection code, generated by performing an operation on expect data based on the read data, to the semiconductor circuit.