Semiconductor Current Monitoring for Latch-Up Protection
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Solution Overview
Problem
Current semiconductor devices face issues with injected current affecting the operation of electronic circuits, leading to potential latch-up and data loss, which existing guard rings and supply voltage control methods do not adequately address.
Innovation Solution
A semiconductor device with a current meter and control unit that measures injected current and switches the circuit to a secure mode or halts operations when current exceeds safe thresholds, using a combination of current sensors and guard rings to shield the circuit and manage power effectively.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a guard ring is implemented to shield the electronic circuit from injected current, then the circuit is protected from latch-up, but the device complexity increases
Solution Approach 1:
The patent combines the current meter function with existing substrate structures by electrically contacting the current meter to the substrate and pad, integrating multiple functions into a unified structure rather than adding separate protective components
Solution Approach 2:
The control unit performs multiple functions: it measures current via the current meter, determines whether latch-up has occurred, and controls the electronic circuit operation. This multi-functional approach reduces the need for separate dedicated protective components
2Productivity
If the electronic circuit operates continuously to maintain productivity, then output is maximized, but the risk of latch-up from injected current increases
Solution Approach 1:
The patent implements a feedback mechanism where the current meter continuously monitors current flow to the substrate, and the control unit uses this information to determine when latch-up has occurred and control the circuit accordingly, creating a closed-loop protection system
Solution Approach 2:
The current meter is positioned to detect current flow before latch-up fully develops, and the control unit is configured to take preventive action by controlling the electronic circuit operation based on the detected current levels, addressing the issue before it causes damage
Data Source
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Figure 5
AI summary
A semiconductor device includes a substrate (1) on which an electronic circuit (40) is provided. One or more pads may be present which can connect the electronic circuit to an external device outside the substrate. A current meter (50) is electrically in contact with at least a part of the substrate and/or the pad. The meter can measure a parameter forming a measure for an amount of a current flowing between the substrate and at least one of the at least one pad. A control unit (60) is connected to the current meter (50) and the electronic circuit (40), for controlling the electronic circuit based on the measured parameter.