Semiconductor Current Sensing for Injected Current Mode Switching
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Solution Overview
Problem
Current semiconductor devices face operational disruptions due to injected current from external devices, which can cause abrupt and unpredictable behavior or data loss, as existing guard rings and current monitoring systems are insufficient in managing excessive current flows.
Innovation Solution
A semiconductor device with a current meter and control unit that measures injected current and switches the electronic circuit to safer modes or halts operations when thresholds are exceeded, utilizing a current sensor and guard ring to shield the circuit and enable controlled operation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a guard ring is implemented to shield the electronic circuit from injected current, then the circuit is protected from latch-up, but the device cannot dynamically respond to varying current levels and may still suffer from abrupt operations when current exceeds protection thresholds
Solution Approach 1:
The patent implements a feedback mechanism where a current sensor continuously monitors the current flowing between the pad and substrate, and a control unit adjusts the operating mode of the electronic circuit based on the measured current level. This closed-loop feedback system enables dynamic adaptation to varying current conditions, resolving the contradiction between static guard ring protection and dynamic current management capability.
Solution Approach 2:
The patent transitions from static guard ring protection to a dynamic system that can adapt its protection level based on real-time current measurements. The control unit dynamically switches between different operating modes (normal mode and safe mode) depending on the measured current level, enabling the device to respond flexibly to varying injected current conditions while maintaining circuit protection.
2Productivity
If the electronic circuit operates in normal mode with high performance, then productivity is maximized, but the circuit becomes vulnerable to injected current causing abrupt operations and data loss
Solution Approach 1:
The patent implements dynamic mode switching that allows the electronic circuit to operate in high-performance normal mode when current levels are safe, and automatically transition to safe mode when injected current is detected. This dynamic adaptation enables the system to maximize productivity during normal operation while ensuring reliability when current threats arise, resolving the contradiction between performance and stability.
Solution Approach 2:
The patent employs preliminary action by proactively switching to safe mode before catastrophic failure can occur. The control unit monitors current levels and preemptively changes the operating mode when threshold values are approached, preventing abrupt operations and data loss before they happen, thus maintaining both productivity and reliability.
3Reliability
If current monitoring and mode switching mechanisms are added to protect against injected current, then reliability is improved, but device complexity increases due to additional components
Solution Approach 1:
The patent applies multi-functionality by designing a control unit that performs multiple functions: it receives current measurements from the sensor, compares measured current against threshold values, determines appropriate operating modes, and controls the electronic circuit accordingly. This multi-functional approach consolidates what could be separate complex components into a single integrated unit, improving reliability while minimizing the increase in device complexity.
Solution Approach 2:
The patent merges the current monitoring function with the existing pad and substrate structure. The current sensor is integrated into the substrate and electrically connected to the pad, combining the protection function with the existing I/O structure. This merging approach enables current protection without adding significant structural complexity to the device.
Data Source
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AI summary
A semiconductor device includes a substrate (1) on which an electronic circuit (40) is provided. One or more pads may be present which can connect the electronic circuit to an external device outside the substrate. A current meter (50) is electrically in contact with at least a part of the substrate and/or the pad. The meter can measure a parameter forming a measure for an amount of a current flowing between the substrate and at least one of the at least one pad. A control unit (60) is connected to the current meter (50) and the electronic circuit (40), for controlling the electronic circuit based on the measured parameter.