Semiconductor Temperature Measurement Using Current Ratio
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Solution Overview
Problem
Existing temperature measurement systems in semiconductor devices, such as integrated circuits, lack accuracy and efficiency in determining operating temperatures, which can lead to overheating or underperformance, as they rely on less precise methods that do not effectively manage thermal limits.
Innovation Solution
A system comprising multiple current sources and p-n junctions, where current sources are adjusted in concert to provide proportional currents to absolute temperature, utilizing a bandgap reference circuit and comparator to accurately determine temperature through precise voltage measurements across resistors, allowing for accurate temperature monitoring and management.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional temperature measurement methods are used in semiconductor devices, then the device can operate, but the temperature measurement accuracy is insufficient leading to improper thermal management
Solution Approach 1:
The patent changes the measurement parameter from conventional voltage-based temperature sensing to current ratio measurement. By measuring the ratio of currents through two p-n junctions biased at different currents, the system achieves higher temperature measurement accuracy. The current ratio method compensates for process variations and provides more reliable thermal management data.
Solution Approach 2:
The patent uses two identical p-n junctions (diodes) with the same physical and electrical characteristics. By creating this copy structure, the measurement becomes self-referencing and immune to common-mode variations. The ratio of currents through these matched junctions provides an accurate temperature indicator that cancels out manufacturing tolerances.
2Measurement precision
If temperature measurement accuracy is improved using advanced methods, then thermal management reliability increases, but the device complexity increases
Solution Approach 1:
The temperature measurement system is self-calibrating through the ratio measurement approach. The two p-n junctions serve their dual purpose: they are part of the normal device operation and simultaneously provide temperature measurement. The measurement system uses itself for calibration, eliminating the need for external reference temperature sources or complex calibration procedures.
Solution Approach 2:
The p-n junctions serve multiple functions: they are part of the normal device circuitry and simultaneously function as temperature sensors. The current measurement circuit serves both to bias the junctions for normal operation and to measure the temperature-dependent current ratio. This multi-functionality reduces overall system complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables precise and efficient temperature measurement and monitoring in semiconductor devices, allowing for optimal operation within thermal limits, extending device lifespan and performance by accurately adjusting operating frequencies based on temperature conditions.
Implementation Method 1
a first voltage measured at a first node and a second voltage measured at a second node are substantially equal
Implementation Method 2
utilizing a bandgap reference circuit and comparator to accurately determine temperature through precise voltage measurements across resistors
Data Source
AI summary
Circuitry for measuring and/or monitoring device temperature may include a first node coupled to ground, and a second node and a first resistor coupled in series to ground and in parallel to the first node. A first current driven to the first node and a second current driven to the second node can be selected such that a first voltage measured at the first node and a second voltage measured at the second node are substantially equal. The circuitry may also include a third node and a second resistor coupled in series to ground. A third current driven to the third node can be selected such that a third voltage measured at the third node is substantially equal to a reference voltage. Measures of the second and third currents and measures of the first and second resistors can be used to determine device temperature.