Semiconductor Data Reliability via Dual-Voltage Read Checkpoint
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Solution Overview
Problem
Semiconductor memory devices, such as flash memory, face issues with read disturbance and data retention degradation, leading to increased error bits over time, which can result in read errors and inefficient use of system resources due to unnecessary error correction and data refresh operations.
Innovation Solution
Implementing a system that reads data at two different voltages and compares the results to determine the need for an error correction process, thereby reducing unnecessary resource consumption by acting as a checkpoint before performing error correction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If error correction and data refresh operations are performed continuously to maintain data reliability, then data reliability is improved, but system resource consumption increases
Solution Approach 1:
The patent applies preliminary action by performing a checkpoint operation (reading data at two different voltages and comparing results) before executing the resource-intensive error correction and data refresh operations. This preliminary check identifies whether errors actually exist, preventing unnecessary resource consumption when data is still reliable
Solution Approach 2:
The patent implements feedback by using the comparison result from the dual-voltage read operation to dynamically determine whether error correction and data refresh operations are needed. The system continuously monitors data reliability through this feedback mechanism and adjusts resource usage accordingly
2Measurement precision
If error correction processes are performed frequently to correct read errors, then data accuracy is improved, but processing time increases
Solution Approach 1:
The checkpoint operation using dual-voltage reading serves as a preliminary filter that quickly identifies whether data contains errors before committing to the time-consuming error correction process. This reduces overall processing time by avoiding unnecessary correction operations
3Reliability
If data refresh operations are performed continuously to prevent data degradation, then data retention is improved, but power consumption increases
Solution Approach 1:
The dual-voltage read comparison acts as a preliminary indicator of data degradation. By checking data reliability before refresh operations, the system only consumes power for refresh when actually needed, preventing continuous unnecessary operations
Data Source
AI summary
A system includes a semiconductor device configured to store data and a controller communicatively coupled to the semiconductor device. The semiconductor device and the controller are configured to; in response to determining that particular data stored in the semiconductor device satisfies a reliability condition, obtain first readout data by reading the particular data at a first read voltage, and obtain second readout data by reading the particular data at a second read voltage. The second read voltage is different from the first read voltage. The semiconductor device and the controller are configured to compare the first readout data and the second readout data and obtain a comparison result; and, based on the comparison result, determine whether to perform an error correction process on the particular data.