Semiconductor Device Dead Time Control via Correlation Map
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Solution Overview
Problem
Existing semiconductor devices face complexity in determining optimal dead time for preventing arm short-circuits, leading to instability in control due to deviations between commanded and actual control values.
Innovation Solution
A semiconductor device with a dead time generating circuit and map memory device that stores a correlation map between control values and optimized dead times, allowing for simple processing to determine and apply the optimal dead time, thereby preventing arm short-circuits while maintaining control stability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If dead time is set to the maximum value to prevent arm short-circuit, then reliability is improved, but device complexity increases due to complex processing required to determine optimal dead time
Solution Approach 1:
The patent pre-calculates and stores the relationship between drive control values and optimal dead times in a correlation map during the design phase. During operation, the system simply looks up the pre-determined optimal dead time in the map based on the current drive control value, eliminating the need for complex real-time calculations while ensuring reliable arm short-circuit prevention.
2Reliability
If dead time is set to maximum value, then arm short-circuit is suppressed, but control stability deteriorates due to deviation between commanded and actual control values
Solution Approach 1:
The patent dynamically adjusts the dead time parameter based on the drive control value by referencing the correlation map. Instead of using a fixed maximum dead time value, the system selects the optimal dead time from the map that corresponds to the current operating conditions, thereby suppressing arm short-circuits while minimizing deviation between commanded and actual control values to maintain control stability.
3Measurement precision
If optimal dead time is computed in real-time, then control precision is improved, but productivity decreases due to complex processing requirements
Solution Approach 1:
The patent creates a simplified copy of the optimal dead time determination process by pre-calculating and storing the correlation between drive control values and optimal dead times in a lookup map. During real-time operation, the system copies this pre-computed information through simple map lookup and interpolation, achieving high precision dead time determination without the computational overhead of real-time optimization algorithms.
Data Source
AI summary
The present invention provides a semiconductor device includes arms formed by two semiconductor elements, a map memory device which stores therein a correlation map between a control value for each of the arms and an optimized dead time to be set for the control value or is capable of storing the same therein, drive control value acquiring means for acquiring a drive control value of each of the arms, and a dead time generating circuit for extracting the optimized dead time corresponding to the drive control value from the correlation map. The time taken until the other of the semiconductor elements is turned on after one thereof has received a command to turn off the same is the optimized dead time extracted by the dead time generating circuit.