Semiconductor Abnormality Detection Circuit Using Sense Signal Voltage
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Solution Overview
Problem
Existing semiconductor switch device failure detection methods are costly and inefficient, particularly when dealing with large numbers of loads, as they require complex circuits and direct current measurement, which increases wiring complexity and costs, and fail to accurately detect failures when the power source is not supplied.
Innovation Solution
A semiconductor abnormality detection circuit that includes a switch device and a sense signal generator, with a controller that binarily switches the instruction voltage to determine the normal operation of the switch device by comparing the sense signal voltage with prescribed off and on voltages, reducing the need for additional components and allowing for reliable failure detection without direct current measurement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If voltage monitoring method is used, then component count is reduced, but detection reliability in zero-power state is insufficient
Solution Approach 1:
The detection circuit performs preliminary detection actions by storing detection results in memory before the power source is fully supplied. The microcontroller executes detection routines in advance, capturing the state of the semiconductor switch device during the power-up transition period, and stores these results for later analysis, enabling reliable failure detection even when the system operates in zero-power states.
2Measurement precision
If direct current measurement is used, then detection accuracy is improved, but wiring complexity increases
Solution Approach 1:
The patent introduces an intermediary detection circuit that indirectly measures current parameters without requiring direct current measurement paths. The circuit uses voltage measurements across known impedances and computational algorithms to derive current information, thereby achieving accurate detection while avoiding the wiring complexity of direct current measurement techniques.
3Reliability
If conventional detection circuits are added for each switch, then detection capability is improved, but cost increases substantially
Solution Approach 1:
The patent implements a universal detection circuit architecture that can monitor multiple semiconductor switch devices using a single microcontroller and shared peripheral components. The system employs software-based detection routines that can be configured to monitor different switches sequentially or simultaneously, eliminating the need for dedicated detection circuits for each switch device and substantially reducing overall system cost while maintaining comprehensive detection capability.
Data Source
AI summary
A semiconductor abnormality detection circuit includes a semiconductor circuit and a controller which controls supply of power to a load. The semiconductor circuit includes a switch device disposed between a power source and the load, and a sense signal generator generating a sense signal corresponding to a current flowing through the switch device. The controller judges that the semiconductor circuit is operating normally if the instruction voltage level is equal to an off-voltage corresponding to non-energization of the switch device and a voltage of the sense signal is equivalent to a prescribed off-voltage corresponding to non-energization of the switch device or the instruction voltage level is equal to an on-voltage corresponding to energization of the switch device and a voltage of the sense signal is equivalent to a prescribed on-voltage corresponding to a steady energization state of the load.