Semiconductor DUT Testing with Voltage Control and Signal Protection

Solution Overview

Problem

Semiconductor devices face challenges in determining the optimum operating voltage to minimize power consumption and heat generation while ensuring stable operation, and are susceptible to system failures due to undefined signals generated during testing.

Innovation Solution

A semiconductor device and method that includes a processing core executing test software to determine the optimum operating voltage, and protection circuits to block undefined signals, with a testing process involving incremental voltage application and signal blocking mechanisms to prevent malfunction.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the power supply voltage is increased to ensure stable operation of the semiconductor device, then the reliability is improved, but the power consumption and heat generation increase

Engineering Contradiction:

Improvestable operationVSAvoidpower consumption

Core Design Contradiction:

ReliabilityVSUse of energy by moving object

Solution Approach 1:

The patent applies parameter changes by dynamically adjusting the power supply voltage to different levels based on operational requirements. The voltage controller changes voltage parameters from a first voltage level to a second voltage level, allowing the device to operate at minimum necessary voltage for stability while reducing unnecessary power consumption and heat generation.

Inventive Principle:

Principle #35Parameter changes

2Reliability

If the power supply voltage is increased to ensure stable operation of the semiconductor device, then the reliability is improved, but the heat generation increases

Engineering Contradiction:

Improvestable operationVSAvoidheat generation

Core Design Contradiction:

ReliabilityVSTemperature

Solution Approach 1:

The patent applies parameter changes by dynamically adjusting the power supply voltage to different levels based on operational requirements. The voltage controller changes voltage parameters from a first voltage level to a second voltage level, allowing the device to operate at minimum necessary voltage for stability while reducing unnecessary power consumption and heat generation.

Inventive Principle:

Principle #35Parameter changes

3Productivity

If the DUT operates during testing, then the test coverage is improved, but undefined signals are generated that may cause system failure

Engineering Contradiction:

Improvetest coverageVSAvoidsystem stability

Core Design Contradiction:

ProductivityVSReliability

Solution Approach 1:

The patent applies intermediary by introducing a protection circuit as a mediator between the DUT and the rest of the system. This protection circuit blocks undefined signals generated by the DUT during testing, preventing system failure while allowing the DUT to operate and be tested.

Inventive Principle:

Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent applies segmentation by dividing the system into distinct functional blocks: the DUT, the protection circuit, and the rest of the system. This segmentation allows the DUT to operate independently during testing while the protection circuit isolates any undefined signals it generates from affecting the rest of the system.

Inventive Principle:

Principle #1Segmentation

Data Source

PatentUS11714122B2Semiconductor device and method of testing the same

Publication Date: 2023.08.01 SAMSUNG ELECTRONICS CO LTD

AI summary

A semiconductor device and a method of testing the same are provided. A semiconductor device includes a Design Under Test (DUT), a processing core configured to execute test software to determine an optimum operating voltage of the DUT, and a protection circuit configured to block the transmission of undefined signals generated by the DUT while the processing core executes the test software.