Semiconductor ECC Architecture for Selective Data and Parity Repair
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Solution Overview
Problem
As data transmission speeds in semiconductor devices increase, so does the probability of errors, necessitating improved error correction mechanisms to enhance reliability.
Innovation Solution
A semiconductor device is designed with a data storage region, a parity storage region, and an error correction circuit that uses Hamming codes to correct errors in both data and parity, along with pre-fail and fail signal generation circuits to detect and manage errors, enabling selective correction and repair of data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If data transmission speed is increased, then operation speed is improved, but error probability increases
Solution Approach 1:
The patent applies preliminary action by generating error correction codes (ECC) and parity bits in advance before data transmission. The ECC circuit pre-calculates correction values based on the data to be transmitted, and these correction codes are stored alongside the data. When errors occur during high-speed transmission, the pre-prepared correction codes enable immediate error correction without requiring retransmission, thus maintaining high speed while improving reliability.
2Reliability
If error correction code is transmitted with data, then reliability is improved, but data transmission efficiency decreases
Solution Approach 1:
The patent implements partial action by selectively applying different levels of error correction to different data portions or transmission conditions. The system can adjust the amount of ECC and parity information added based on the specific data importance, transmission channel conditions, and performance requirements. This allows the system to add error correction only where necessary, improving reliability for critical data while maintaining higher efficiency for less critical transmissions.
3Productivity
If selective error correction is implemented, then error correction efficiency is improved, but device complexity increases
Solution Approach 1:
The patent applies segmentation by dividing the error correction function into separate modular components: an ECC generation circuit that creates correction codes, a parity generation circuit that creates additional check bits, and an ECC correction circuit that performs the actual error correction. Each module handles a specific aspect of error correction, allowing the system to selectively activate different correction mechanisms based on error types and severity. This modular segmentation improves correction efficiency while managing complexity through functional separation.
Data Source
AI summary
A semiconductor device may include a data storage region, a parity storage region and an error correction circuit. The data storage region may be configured to store first data and second data. The parity storage region may be configured to store a parity. The error correction circuit may be configured to correct an error of the first data or an error of the second data and the parity, based on a transmission selection signal.


