Semiconductor Package Electrode Layout for Flexible Land Patterns

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Solution Overview

Problem

Semiconductor devices face challenges in being mounted on substrates with various land pattern sizes due to the limitations in the exposed surface areas of electrodes and die pads, which restrict their compatibility and mounting strength.

Innovation Solution

The semiconductor device design includes a die pad and electrodes with specific exposed surface areas and shapes, where the area of the second surface of the electrodes is set smaller than the fourth surface within the resin member for mounting flexibility and the first surface of the die pad is larger for increased connection strength, allowing for mounting on substrates with diverse land pattern sizes while maintaining adhesiveness and strength.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If the exposed surface area of electrodes is increased to improve mounting compatibility, then the electrodes become more prone to fracture or detachment during cutting

Engineering Contradiction:
Improvemounting compatibilityVSAvoidelectrode strength
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The patent applies local quality by creating different exposed surface areas for different electrodes. Specifically, the first electrode has a larger exposed surface area than the second electrode, allowing each electrode to be optimized for its specific function - the larger electrode provides better mounting compatibility while the smaller electrode maintains sufficient strength and reduces fracture risk during cutting

Inventive Principle:
Principle #3Local quality

2Strength

If the exposed surface area of die pad is increased to improve connection strength, then the overall device size increases

Engineering Contradiction:
Improveconnection strengthVSAvoiddevice size
Core Design Contradiction:
StrengthVSArea of stationary object

Solution Approach 1:

The patent applies local quality by creating an asymmetric configuration where only specific portions of the die pad and electrodes have exposed surfaces. The die pad has a first exposed surface area and a second exposed surface area, with the first electrode having a larger exposed surface area than the second electrode. This localized exposure strategy provides sufficient connection strength at critical interfaces while minimizing the overall device footprint

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS12062595B2Semiconductor device
Publication Date: 2024.08.13 KK TOSHIBA
  • US12062595B2 patent drawing
  • US12062595B2 patent drawing
  • US12062595B2 patent drawing

AI summary

A semiconductor device includes a resin member, a die pad including a first surface on which a semiconductor chip is disposed and covered by the resin member, and a second surface opposite to the first surface and partially covered by the resin member such that a first portion of the second surface is exposed from the resin member, and a plurality of electrodes each separated from the die pad and including a first surface connected to the semiconductor chip and covered by the resin member, and a second surface partially covered by the resin member such that a second portion of the second surface is exposed from the resin member. The first portion of the die pad includes at least four sides, each of which is nonparallel to a side of the second portion of one of the electrodes that faces the side.