Semiconductor Electrode Shape Control via Aluminum Gradient Etching

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current semiconductor device manufacturing processes struggle to create electrodes with complex shapes and uniform electric field distribution, leading to high electric field intensity at edges, which degrades device performance and reliability.

Innovation Solution

An electrode shape controlling layer with adjustable aluminum content is used, allowing for varying etching speeds to create electrodes with specific cross-sectional shapes, such as trapezoidal or U-shaped, which disperses or gentles the electric field distribution.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional planar electrode structures are used, then manufacturing process is simple, but electric field distribution is non-uniform with high intensity at edges

Engineering Contradiction:
Improvedevice reliabilityVSAvoidelectrode structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent transitions from conventional planar (2D) electrode structures to three-dimensional electrode structures with vertical components. The electrodes are configured to extend vertically from the substrate surface, creating a 3D geometry that fundamentally changes the electric field distribution pattern from concentrated edge fields to more uniform distributed fields throughout the device volume.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent employs curved or rounded electrode surfaces instead of sharp edges. The vertical electrodes have rounded tops and smooth transitions, eliminating the sharp corners that concentrate electric fields. This curvature distributes the electric field more evenly across the electrode surfaces, preventing localized field intensity peaks that lead to breakdown.

Inventive Principle:
Principle #14Spheroidality (Curvature)

2Reliability

If field plates are added to improve electric field distribution, then electric field intensity is reduced, but manufacturing process complexity increases

Engineering Contradiction:
Improvebreakdown voltageVSAvoidmanufacturing process complexity
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent combines the electrode structure with the field control function into a single integrated component. Instead of adding separate field plates to conventional electrodes, the electrodes themselves are designed with vertical extensions and curved surfaces that simultaneously serve as both the electrical contact and the field-distributing element, eliminating the need for additional field plate structures.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The vertical electrodes serve multiple functions: they provide the necessary electrical connection to the active regions while simultaneously acting as field-distributing structures. The same electrode components that carry current also control the electric field distribution through their 3D geometry, reducing the need for specialized field control elements.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Reliability

If gate shape is controlled to improve electric field distribution, then device performance is improved, but manufacturing precision requirements increase

Engineering Contradiction:
Improvedevice performanceVSAvoidgate shape precision
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent employs curved or rounded electrode surfaces instead of sharp edges. The vertical electrodes have rounded tops and smooth transitions, eliminating the sharp corners that concentrate electric fields. This curvature distributes the electric field more evenly across the electrode surfaces, preventing localized field intensity peaks that lead to breakdown.

Inventive Principle:
Principle #14Spheroidality (Curvature)

4Reliability

If electrodes with complex shapes are manufactured, then electric field distribution is improved, but manufacturing capability is challenged

Engineering Contradiction:
Improveelectric field distributionVSAvoidmanufacturing capability
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent transitions from conventional planar (2D) electrode structures to three-dimensional electrode structures with vertical components. The electrodes are configured to extend vertically from the substrate surface, creating a 3D geometry that fundamentally changes the electric field distribution pattern from concentrated edge fields to more uniform distributed fields throughout the device volume.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the manufacture of electrodes with complex shapes, improving electric field distribution and enhancing semiconductor device performance by increasing breakdown voltage and reliability.

Implementation Method 1

When the electrode shape controlling layer is etched, the horizontal etching speed and the vertically etching speed vary based on the content of aluminum

Methodology Applied
Scientific EffectEtching:

Data Source

PatentEP3010043B1Semiconductor device and manufacturing method therefor
Publication Date: 2019.03.06 ENKRIS SEMICON
  • EP3010043B1 patent drawingFigure 1~2
  • EP3010043B1 patent drawingFigure 3A~3B
  • EP3010043B1 patent drawingFigure 3C~3D1

AI summary

A semiconductor device and a manufacturing method therefor are disclosed. The semiconductor device comprises: a semiconductor device active region (1); an electrode shape controlling layer (2) disposed on the semiconductor device active region (1), the electrode shape controlling layer (2) containing aluminum, the content of aluminum being reduced in a direction from bottom to up from the semiconductor device active region (1), an electrode region being disposed on the electrode shape controlling layer (2), a groove extended toward the semiconductor device active region (1) and penetrating through the electrode shape controlling layer (2) longitudinally being disposed in the electrode region, all or part of a side surface of the groove having a shape of one of a straight slope, a concave slope protruded away from a central line of the groove and a convex slope protruded toward the central line of the groove; and an electrode (5) disposed in the groove in the electrode region entirely or partially, the electrode (5) having a shape matching with the shape of the groove, a bottom portion of the electrode (5) being contacted with the semiconductor device active region (1). By controlling the shape of the electrode (5), the electrical field intensity near the electrode (5) is changed and performances of the semiconductor device, such as breakdown voltage and reliability, are improved.