Semiconductor EMI Prediction via Circuit Model Correction

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Solution Overview

Problem

The precise prediction of electromagnetic compatibility (EMC) characteristics, particularly electromagnetic interference (EMI), in semiconductor integrated circuits (ICs) is challenging, requiring significant efforts to verify and meet standard values, as existing circuit simulators struggle to accurately model and correct EMI.

Innovation Solution

A design supporting apparatus that includes an input device for receiving transient current waveforms, a modeling part to generate evaluation and countermeasure circuit models, calculation parts to assess EMI, and correction parts to adjust circuit elements, ensuring calculated EMI values align with measured values and meet standard standards.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of time

If circuit simulators are used to predict EMI characteristics, then verification can be performed at design stage, but calculation precision of EMI is insufficient

Engineering Contradiction:
Improveverification timeVSAvoidEMI calculation precision
Core Design Contradiction:
Loss of timeVSMeasurement precision

Solution Approach 1:

The invention creates a copy of the actual measurement system by constructing an evaluation circuit model that includes equivalent circuits of measurement devices and evaluation boards. This model copy allows simulation-based prediction that closely matches actual measurement results, achieving both early verification and high precision through the mathematical modeling of the entire measurement system including parasitic elements

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The invention improves EMI calculation precision by dynamically adjusting circuit parameters in the evaluation circuit model. The correction process modifies parameter values (such as resistance, inductance, capacitance) of the equivalent circuit to minimize the difference between calculated and measured EMI values, thereby achieving high precision prediction while maintaining the ability to perform early design-stage verification

Inventive Principle:
Principle #35Parameter changes

2Reliability

If EMI verification is performed thoroughly to meet standard values, then EMC characteristics are improved, but great amount of efforts are required

Engineering Contradiction:
ImproveEMC characteristicsVSAvoidverification effort
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The invention performs preliminary EMI verification at the design stage using the evaluation circuit model before actual hardware implementation. By calculating EMI characteristics of the model and comparing with measured values, designers can identify and correct EMI issues in the design phase, avoiding the need for extensive physical prototyping and measurement iterations, thus reducing overall verification effort while ensuring EMC compliance

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The invention implements a feedback mechanism where the difference between calculated EMI values from the evaluation circuit model and actual measured EMI values is used to correct and refine the model parameters. This feedback loop continuously improves the accuracy of the simulation model, enabling reliable prediction of EMI characteristics and reducing the need for repeated physical measurements, thereby simplifying the verification process while maintaining high EMC standards

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS10255405B2Supporting apparatus of semiconductor integrated circuit, countermeasure method of electromagnetic interference of semiconductor integrated circuit, and recording medium
Publication Date: 2019.04.09 ROHM CO LTD
  • US10255405B2 patent drawing
  • US10255405B2 patent drawing
  • US10255405B2 patent drawing

AI summary

A design supporting apparatus of a semiconductor integrated circuit includes an input device configured to receive data of a transient current waveform, a first modeling part configured to model the semiconductor integrated circuit as a current source for generating the transient current waveform and to connect the current source and an equivalent circuit of an evaluation board to generate an evaluation circuit model, a first calculation part configured to calculate electromagnetic interference of the evaluation circuit model, a first correction part configured to correct a portion of the equivalent circuit of the evaluation board, a second modeling part configured to add an additional circuit to a corrected evaluation circuit model to generate a countermeasure circuit model, a second calculation part configured to calculate electromagnetic interference of the countermeasure circuit model, and a second correction part configured to correct the additional circuit.