Semiconductor Emitter Pad Segmentation for Zinc Deposition Control
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Solution Overview
Problem
The existing semiconductor devices with small area Kelvin emitter electrode pads face issues with the peeling off of bonding wires or clip conductors due to excessive zinc deposition during the zincate treatment, leading to unreliable connections.
Innovation Solution
The semiconductor device design includes a first conductive layer connected to the emitter region with a larger emitter pad and a second conductive layer having a smaller Kelvin emitter pad and a relay pad, where the Kelvin emitter pad and relay pad are electrically connected, and a clip conductor is used to connect the emitter and relay pads, preventing excessive zinc deposition and enhancing connection stability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a small area electrode pad is used for Kelvin emitter, then the device can detect emitter potential, but the connection portion of bonding wire or clip conductor may be peeled off due to excessive zinc deposition
Solution Approach 1:
The electrode pad structure is segmented into two distinct conductive layers: a first conductive layer with a first electrode pad having a larger area, and a second conductive layer with a second electrode pad (Kelvin emitter pad) having a smaller area. This segmentation allows the smaller Kelvin emitter pad to perform potential detection while the larger first electrode pad provides a robust connection area that prevents peeling during zincate treatment.
2Measurement precision
If a small area electrode pad is used for Kelvin emitter, then the device can detect emitter potential, but the bonding wire or clip conductor connection becomes unreliable
Solution Approach 1:
The electrode pad structure is segmented into two distinct conductive layers: a first conductive layer with a first electrode pad having a larger area, and a second conductive layer with a second electrode pad (Kelvin emitter pad) having a smaller area. This segmentation allows the smaller Kelvin emitter pad to perform potential detection while the larger first electrode pad provides a robust connection area that prevents peeling during zincate treatment.
3Strength
If a large area electrode pad is used for emitter, then the connection strength is improved, but the device cannot effectively detect emitter potential
Solution Approach 1:
The electrode pad structure is segmented into two distinct conductive layers: a first conductive layer with a first electrode pad having a larger area, and a second conductive layer with a second electrode pad (Kelvin emitter pad) having a smaller area. This segmentation allows the smaller Kelvin emitter pad to perform potential detection while the larger first electrode pad provides a robust connection area that prevents peeling during zincate treatment.
Solution Approach 2:
The first conductive layer acts as an intermediary between the emitter region and the external connection. It provides a large area for robust mechanical and electrical connection while the second conductive layer with the smaller Kelvin emitter pad enables precise potential detection, thus mediating between the conflicting requirements of connection strength and measurement precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration prevents peeling of the bonding wire connection portion by controlling zinc deposition and allows for increased current flow, ensuring reliable electrical connections and improved device performance.
Implementation Method 1
excessive zinc deposition during the zincate treatment
Data Source
AI summary
First conductive layer is connected to an impurity region which is a source region or an emitter region. A first conductive layer having an emitter pad and a second conductive layer having a Kelvin emitter pad and a relay pad are separated. A plane occupied area of the Kelvin emitter pad is smaller than a plane occupied area of the emitter pad.


