Semiconductor Error Correction Circuit Using Syndrome Signals
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Solution Overview
Problem
As semiconductor devices increase data transmission speeds, the likelihood of errors during data transmission also rises, necessitating more reliable error correction mechanisms to maintain data integrity.
Innovation Solution
The semiconductor device incorporates an error correction circuit and a fuse signal generation circuit to generate a syndrome signal from data and parity bits, enabling the repair of cell arrays by generating repair control signals to correct errors, utilizing an error correction code and Hamming code scheme.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If data transmission speed is increased, then productivity is improved, but the probability of errors increases
Solution Approach 1:
The patent introduces an error correction code (ECC) as an intermediary mechanism between data transmission and reliability assurance. The ECC generates syndrome signals that act as mediators to detect and correct errors without requiring retransmission, thus maintaining high data transmission speeds while improving reliability through automated error correction.
Solution Approach 2:
The patent implements a feedback mechanism where syndrome signals are continuously generated from transmitted data and used to correct errors in real-time. The repair control circuit receives syndrome signals and generates repair control signals that feed back to correct errors in cell arrays, creating a closed-loop system that maintains data integrity during high-speed transmission.
2Reliability
If error correction code is implemented, then reliability is improved, but device complexity increases
Solution Approach 1:
The patent segments the error correction functionality into distinct modular components: syndrome generation circuit, repair control circuit, and fuse signal generation circuit. Each component performs a specific function in the error correction process, allowing for independent optimization and simplifying the overall design while maintaining comprehensive error correction capability.
Solution Approach 2:
The patent designs the error correction circuit to handle multiple types of errors and data configurations through a universal syndrome generation mechanism. The same circuit architecture can correct various error patterns by generating appropriate syndrome signals, reducing the need for multiple specialized correction circuits and thereby managing complexity.
Data Source
AI summary
A semiconductor device may include an error correction circuit and a fuse signal generation circuit. The error correction circuit may be configured to generate a syndrome signal from data using an error correction code. The fuse signal generation circuit may be configured to receive the syndrome signal to generate a fuse signal for repairing a cell array storing the data.