Semiconductor Integrated Circuit Error Detection via Shared Output Terminal
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Solution Overview
Problem
Existing semiconductor integrated circuits lack an effective method to determine the specific content and location of abnormalities within a system, leading to inefficiencies in error detection and response.
Innovation Solution
A semiconductor integrated circuit design incorporating multiple abnormality detectors and a reference voltage output circuit that uses switches and resistors to output distinct error signals based on detected abnormalities, allowing for the identification of abnormal conditions through a common output terminal.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple separate error output terminals are provided for each abnormality detector, then the ability to detect specific abnormalities is improved, but the device complexity increases
Solution Approach 1:
The patent combines multiple error output terminals into a single common output terminal. Multiple abnormality detectors share this common terminal, and their detection results are transmitted through shared signal lines with switch elements. This merging approach reduces the number of output terminals and signal lines while maintaining the ability to identify specific abnormalities through the switching mechanism.
Solution Approach 2:
The patent introduces switch elements as intermediary components between the abnormality detectors and the common output terminal. These switches act as mediators that selectively connect different detectors to the common terminal based on which abnormality is detected. This intermediary mechanism enables precise error identification without requiring separate dedicated output terminals for each detector.
2Device complexity
If a common output terminal is shared by multiple abnormality detectors, then the device complexity is reduced, but the ability to determine specific abnormality content deteriorates
Solution Approach 1:
The patent segments the signal transmission path by introducing switch elements that can selectively connect different abnormality detectors to the common output terminal. This segmentation of the transmission path ensures that only the relevant detector's signal is active at any given time, preventing signal mixing and preserving the integrity of error information even though the output terminal is shared.
Solution Approach 2:
The patent implements dynamic switching of signal connections based on which abnormality is detected. The switch elements dynamically change their connection state to route the appropriate detector's output to the common terminal. This dynamic behavior ensures that the common output terminal conveys specific and accurate error information without loss, despite being shared by multiple detectors.
Data Source
AI summary
A semiconductor integrated circuit includes abnormality detectors configured to detect abnormalities in the semiconductor integrated circuit, and a reference voltage output circuit. The reference voltage output circuit includes switches controlled in accordance with detection signals from the abnormality detectors. The reference voltage output circuit is configured to output as an error signal, a reference voltage having one of a plurality of different values depending on conduction states of the switches of the reference voltage output circuit.