Semiconductor Drive Circuit With Fast Error Waveform Identification
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Solution Overview
Problem
Conventional semiconductor element drive devices require a longer time to identify the type of error state due to the larger pulse width of the identification signal, making it difficult for external control devices to recognize the error state in an early stage.
Innovation Solution
A semiconductor element drive device with error state detection circuits generating error signals, an error state identification signal generation circuit producing signals with distinct waveforms and smaller pulse widths, and a protection operation signal generation circuit to protect the semiconductor element based on these signals, allowing early identification of error states.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the pulse width of the identification signal is increased to ensure reliable error state identification, then the external control device can accurately identify the error state type, but the time required to output the identification signal increases, delaying early error detection
Solution Approach 1:
The patent changes the pulse width parameter of the identification signal to be smaller than conventional designs. Specifically, the identification signal pulse width is set to be shorter than the error signal pulse width, enabling faster output while maintaining distinguishability through waveform characteristics. This parameter optimization resolves the contradiction by achieving both speed and accuracy.
2Measurement precision
If multiple separate terminals are provided for different error state identification signals, then each error state can be independently identified, but the device complexity and number of terminals increase
Solution Approach 1:
The patent implements a universal identification signal output terminal that handles all error state identification signals. The single terminal outputs identification signals with different waveforms corresponding to different error states, eliminating the need for multiple dedicated terminals. This multi-functional approach maintains comprehensive error state identification capability while reducing terminal count and device complexity.
Solution Approach 2:
The patent uses waveform characteristics as distinguishing features for different error states, analogous to using different colors for identification. Each error state is represented by a unique waveform pattern (e.g., different pulse widths, frequencies, or shapes), allowing the external control device to identify the specific error type from a single terminal output without requiring multiple physically separate terminals.
Data Source
AI summary
An object is to provide a technique which enables an outer portion to identify a type of an error state from an identification signal in an early state. A semiconductor element drive device includes a plurality of error state detection circuits generating an error signal corresponding to an error state, an error state identification signal generation circuit generating an error state identification signal having a different waveform for each type of the error state and having a pulse width smaller than each error signal based on the plurality of error signals generated in the plurality of error state detection circuits, respectively, and an error state identification signal output terminal outputting an error state identification signal.